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科研机构
半导体研究所 [38]
内容类型
期刊论文 [31]
会议论文 [7]
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2011 [4]
2010 [6]
2008 [3]
2007 [3]
2006 [10]
2005 [1]
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光电子学 [38]
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Growth of high quality Ge epitaxial films on Si substrate by low temperature buffer technique
期刊论文
guangdianzi jiguang/journal of optoelectronics laser, 2011, 卷号: 22, 期号: 7, 页码: 1030-1033
Zhou, Zhi-Wen
;
He, Jing-Kai
;
Li, Cheng
;
Yu, Jin-Zhong
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  |  
浏览/下载:47/0
  |  
提交时间:2012/06/13
Atomic force microscopy
Atomic spectroscopy
Chemical vapor deposition
Diffraction
Epitaxial growth
Germanium
Raman spectroscopy
Semiconducting silicon compounds
Substrates
Surface morphology
Ultrahigh vacuum
X ray diffraction
Relationship between the growth rate and Al incorporation of AlGaN by metalorganic chemical vapor deposition
期刊论文
journal of alloys and compounds, 2011, 卷号: 509, 期号: 3, 页码: 748-750
作者:
Yang H
;
Jiang DS
;
Le LC
;
Zhang SM
;
Wu LL
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  |  
浏览/下载:49/3
  |  
提交时间:2011/07/05
Nitride materials
Crystal growth
Composition fluctuations
X-ray diffraction
LAYER
Improved performance of UV-LED by p-AlGaN with graded composition
期刊论文
physica status solidi(c) current topics in solid state physics, 2011, 卷号: 8, 期号: 2, 页码: 461-463
Yan, Jianchang
;
Wang, Junxi
;
Cong, Peipei
;
Sun, Lili
;
Liu, Naixin
;
Liu, Zhe
;
Zhao, Chao
;
Li, Jinmin
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  |  
浏览/下载:44/0
  |  
提交时间:2012/06/14
Atomic force microscopy
Diffraction
Electroluminescence
Gallium
Metallorganic chemical vapor deposition
Organic chemicals
Organic light emitting diodes(OLED)
Organometallics
Structure(composition)
Ultraviolet radiation
X ray diffraction
Analysis of Modified Williamson-Hall Plots on GaN Layers
期刊论文
chinese physics letters, 2011, 卷号: 28, 期号: 1, 页码: article no.16101
Liu JQ
;
Qiu YX
;
Wang JF
;
Xu K
;
Yang H
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  |  
浏览/下载:39/3
  |  
提交时间:2011/07/05
X-RAY-DIFFRACTION
THIN-FILMS
GROWTH
Structural and optical properties of Al1-xInxN epilayers on GaN template grown by metalorganic chemical vapor deposition
期刊论文
chinese physics b, 2010, 卷号: 19, 期号: 2, 页码: art. no. 026804
Lu GJ (Lu Guo-Jun)
;
Zhu JJ (Zhu Jian-Jun)
;
Jiang DS (Jiang De-Sheng)
;
Wang YT (Wang Yu-Tian)
;
Zhao DG (Zhao De-Gang)
;
Liu ZS (Liu Zong-Shun)
;
Zhang SM (Zhang Shu-Ming)
;
Yang H (Yang Hui)
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  |  
浏览/下载:114/2
  |  
提交时间:2010/04/22
metalorganic chemical vapor deposition
Al1-xInxN
gradual variation in composition
optical reflectance spectra
X-RAY-DIFFRACTION
PHASE EPITAXY
RELAXATION
FILMS
HETEROSTRUCTURES
SEPARATION
DYNAMICS
ALLOYS
REGION
LAYERS
Evaluation of both composition and strain distributions in InGaN epitaxial film using x-ray diffraction techniques
期刊论文
chinese physics b, 2010, 卷号: 19, 期号: 10, 页码: art. no. 106802
Guo X (Guo Xi)
;
Wang H (Wang Hui)
;
Jiang DS (Jiang De-Sheng)
;
Wang YT (Wang Yu-Tian)
;
Zhao DG (Zhao De-Gang)
;
Zhu JJ (Zhu Jian-Jun)
;
Liu ZS (Liu Zong-Shun)
;
Zhang SM (Zhang Shu-Ming)
;
Yang H (Yang Hui)
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  |  
浏览/下载:30/0
  |  
提交时间:2010/11/02
InGaN
In-plane grazing incidence x-ray diffraction
reciprocal space mapping
biaxial strain
CRITICAL LAYER THICKNESS
OPTICAL-PROPERTIES
LATTICE-CONSTANTS
GAN
HETEROSTRUCTURES
ALLOYS
WELLS
Investigation on the strain relaxation of InGaN layer and its effects on the InGaN structural and optical properties
期刊论文
physica b-condensed matter, 2010, 卷号: 405, 期号: 22, 页码: 4668-4672
Wang H (Wang H.)
;
Jiang DS (Jiang D. S.)
;
Jahn U (Jahn U.)
;
Zhu JJ (Zhu J. J.)
;
Zhao DG (Zhao D. G.)
;
Liu ZS (Liu Z. S.)
;
Zhang SM (Zhang S. M.)
;
Qiu YX (Qiu Y. X.)
;
Yang H (Yang H.)
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  |  
浏览/下载:38/0
  |  
提交时间:2010/12/12
InGaN
Dislocation
Metalorganic chemical vapor deposition
High resolution X-ray diffraction
Cathodoluminescence
MISFIT DISLOCATIONS
QUANTUM-WELLS
BAND-GAP
EPILAYERS
GENERATION
ALLOYS
INN
Cathodoluminescence study on in composition inhomogeneity of thick InGaN layer
期刊论文
thin solid films, 2010, 卷号: 518, 期号: 17, 页码: 5028-5031
Wang H (Wang H.)
;
Jiang DS (Jiang D. S.)
;
Jahn U (Jahn U.)
;
Zhu JJ (Zhu J. J.)
;
Zhao DG (Zhao D. G.)
;
Liu ZS (Liu Z. S.)
;
Zhang SM (Zhang S. M.)
;
Yang H (Yang H.)
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  |  
浏览/下载:61/2
  |  
提交时间:2010/08/17
Gallium Nitride
Indium Gallium Nitride
Cathodeluminescence
X-ray Diffraction
Metal-Organic Chemical Vapor Deposition
Microstructure and strain analysis of GaN epitaxial films using in-plane grazing incidence x-ray diffraction
期刊论文
chinese physics b, 2010, 卷号: 19, 期号: 7, 页码: art. no. 076804
Guo X (Guo Xi)
;
Wang YT (Wang Yu-Tian)
;
Zhao DG (Zhao De-Gang)
;
Jiang DS (Jiang De-Sheng)
;
Zhu JJ (Zhu Jian-Jun)
;
Liu ZS (Liu Zong-Shun)
;
Wang H (Wang Hui)
;
Zhang SM (Zhang Shu-Ming)
;
Qiu YX (Qiu Yong-Xin)
;
Xu K (Xu Ke)
;
Yang H (Yang Hui)
收藏
  |  
浏览/下载:69/0
  |  
提交时间:2010/08/17
in-plane grazing incidence x-ray diffraction
gallium nitride
mosaic structure
biaxial strain
CHEMICAL-VAPOR-DEPOSITION
LATTICE-CONSTANTS
ALN
An experimental study about the influence of well thickness on the electroluminescence of InGaN/GaN multiple quantum wells
期刊论文
journal of alloys and compounds, 2010, 卷号: 489, 期号: 2, 页码: 461-464
作者:
Wang YT
;
Zhao DG
;
Zhang SM
;
Yang H
;
Jiang DS
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  |  
浏览/下载:151/11
  |  
提交时间:2010/04/04
Nitride materials
Crystal growth
X-ray diffraction
TIME-RESOLVED PHOTOLUMINESCENCE
LIGHT-EMITTING-DIODES
PIEZOELECTRIC FIELDS
LASER-DIODES
DEPENDENCE
RECOMBINATION
POLARIZATION
DYNAMICS
GROWTH
MOCVD
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