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Measurement system of large-scale sleeve roundness error 期刊论文
hongwai yu jiguang gongcheng/infrared and laser engineering, 2016, 卷号: 45, 期号: 1
作者:  Liu, Jie
收藏  |  浏览/下载：21/0  |  提交时间：2016/03/14
Measurement of excited layer thickness in highly photo-excited GaAs 会议论文
international symposium on optical measurement technology and instrumentation, beijing, china, 2016-05-09
作者:  Liang, Lingliang;  Tian, Jinshou;  Wang, Tao;  Wu, Shengli;  Li, Fuli
收藏  |  浏览/下载：23/0  |  提交时间：2017/01/17
Reflectivity and depth images based on time-correlated single photon counting technique 会议论文
international symposium on optical measurement technology and instrumentation, beijing, china, 2016-05-09
作者:  Duan, Xuejie;  Ma, Lin;  Kang, Yan;  Zhang, Tongyi
收藏  |  浏览/下载：15/0  |  提交时间：2017/01/17

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