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浏览/检索结果: 共6条，第1-6条 帮助 限定条件 发表日期：2001    内容类型：期刊论文     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 A dramatic decrease of the dislocation velocity in Ni(3)Al single crystals under the influence of hydrogen 期刊论文 INTERMETALLICS, 2001, 卷号: 9, 期号: 4, 页码: 355-360 作者:  Jiang, CB;  Li, H;  Tan, J;  Wu, SD;  Rong, LJ 收藏  |  浏览/下载：16/0  |  提交时间：2021/02/02 nickel aluminides, based on Ni(3)Al  hydrogen embrittlement  defects : dislocation geometry and arrangement   A dramatic decrease of the dislocation velocity in Ni(3)Al single crystals under the influence of hydrogen 期刊论文 INTERMETALLICS, 2001, 卷号: 9, 期号: 4, 页码: 355-360 作者:  Jiang, CB;  Li, H;  Tan, J;  Wu, SD;  Rong, LJ 收藏  |  浏览/下载：17/0  |  提交时间：2021/02/02 nickel aluminides, based on Ni(3)Al  hydrogen embrittlement  defects : dislocation geometry and arrangement   Effect of carbon and phosphorous on the solidification microstructure in a Cr-Ni-Mn-N austenitic hydrogen-resistant steel 期刊论文 Journal of Materials Science & Technology, 2001, 卷号: 17, 页码: S81-S84 J. Tan; L. M. Ma; S. X. Li; L. J. Rong; J. C. Yuan; Y. Y. Li 收藏  |  浏览/下载：8/0  |  提交时间：2012/04/14 alloys   New threshold voltage shift model due to radiation in fully-depleted SOI MOSFET 期刊论文 tien tzu hsueh paoacta electronica sinica, 2001 Wan, Xin-Heng; Zhang, Xing; Tan, Jing-Rong; Gao, Wen-Yu; Huang, Ru; Wang, Yang-Yuan 收藏  |  浏览/下载：4/0  |  提交时间：2015/11/17 New lifetime prediction model for nMOSFET with ultrathin gate oxides under hot-carrier stress 期刊论文 pan tao ti hsueh paochinese journal of semiconductors, 2001 Mu, Fu-Chen; Xu, Ming-Zhen; Tan, Chang-Hua; Duan, Xiao-Rong 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/17 Statistical failure characteristics of N-MOSFET's with ultrathin gate oxides under FN stress and lifetime prediction 期刊论文 pan tao ti hsueh paochinese journal of semiconductors, 2001 Mu, Fu-Chen; Xu, Ming-Zhen; Tan, Chang-Hua; Duan, Xiao-Rong 收藏  |  浏览/下载：4/0  |  提交时间：2015/11/17