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北京大学 [6]
山东大学 [3]
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武汉岩土力学研究所 [3]
西安交通大学 [2]
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Nondestructive Stress Detection of Aluminum Matrix Composites Based on Luminescence Characteristics of Eu3+ Ions
期刊论文
Journal of Materials Engineering and Performance, 2022
作者:
He, Lin
;
Ma, Chao
;
Dong, Qizheng
;
Li, Wensheng
;
Weimin, Sun
收藏
  |  
浏览/下载:35/0
  |  
提交时间:2022/09/22
Alumina
Aluminum alloys
Aluminum oxide
Emission spectroscopy
Europium compounds
Luminescence
Nondestructive examination
Red Shift
Reinforcement
Yttrium aluminum garnet
Aluminium matrix composites
Barycenters
Eu3+ ion
Lattice symmetry
Luminescence characteristics
Non destructive
Non destructive evaluation
Reinforced aluminum
Stress detection
YAG
Modeling and Optimization of Dual Active Bridge DC-DC Converter with Dead-Time Effect under Triple-Phase-Shift Control
期刊论文
ENERGIES, 2019, 卷号: 12, 期号: 6
作者:
Song, Chaochao
;
Chen, Alian
;
Pan, Yiwei
;
Du, Chunshui
;
Zhang, Chenghui
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2019/12/11
dual active bridge DC-DC converter
dead-time effect
phase-shift
errors
transmission power model
soft-switching operation
current
stress
Thermal residual stress evaluation based on phase-shift lateral shearing interferometry
期刊论文
OPTICS AND LASERS IN ENGINEERING, 2018, 卷号: 105, 页码: 182-187
作者:
Dai, Xiangjun
;
Yun, Hai
;
Shao, Xinxing
;
Wang, Yanxia
;
Zhang, Donghuan
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/12/11
Thermal residual stress
Lateral shearing interferometry
Phase shift
Transparent material
Salinity-induced cellular cross-talk in carbon partitioning reveals starch-to-lipid biosynthesis switching in low-starch freshwater algae
期刊论文
BIORESOURCE TECHNOLOGY, 2018, 卷号: 250, 页码: 449-456
作者:
Zhang, Lijie
;
Pei, Haiyan
;
Chen, Shuaiqi
;
Jiang, Liqun
;
Hou, Qingjie
收藏
  |  
浏览/下载:9/0
  |  
提交时间:2019/12/11
Low-starch algae
Freshwater algae
Salinity stress
Starch-to-lipid
shift
Carbon partitioning
Potential of Detecting the Sulfur Dioxide Stress on Landscape Plants in Spectral Reflectance Data
期刊论文
JOURNAL OF THE INDIAN SOCIETY OF REMOTE SENSING, 2018, 卷号: 46, 期号: 4
作者:
Wang, Di
;
Liu, Ziqi
;
Dian, Yuanyong
;
Zhou, Zhixiang
;
Fang, Shenghui
收藏
  |  
浏览/下载:12/0
  |  
提交时间:2019/12/05
Spectral reflectance
Sulfur dioxide stress
Sulfur content of leaf
Chlorophyll content
Red edge position shift
The electrical performance and gate bias stability of an amorphous InGaZnO thin-film transistor with HfO2 high-k dielectrics
期刊论文
SOLID-STATE ELECTRONICS, 2017, 卷号: 133, 页码: 6-9
作者:
Wang, Ruo Zheng
;
Wu, Sheng Li
;
Li, Xin Yu
;
Zhang, Jin Tao
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/11/26
HfO2
Stacked dielectrics
Threshold voltage shift
Transfer characteristics
Negative and positive gate bias stress
Sensitivity to high temperature and water stress in recalcitrant Baccaurea ramiflora seeds
期刊论文
JOURNAL OF PLANT RESEARCH, 2016, 卷号: 129, 期号: 4, 页码: 637-645
作者:
Tan, Yunhong
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  |  
浏览/下载:21/0
  |  
提交时间:2016/07/25
High temperature stress
Rainforest fragmentation
Recalcitrant seeds
Seed germination
Species shift
Water restriction
Unified Triple-Phase-Shift Control to Minimize Current Stress and Achieve Full Soft-Switching of Isolated Bidirectional DC-DC Converter
期刊论文
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2016, 卷号: 63, 期号: [db:dc_citation_issue], 页码: 4169-4179
作者:
Huang, Jun
;
Wang, Yue
;
Li, Zhuoqiang
;
Lei, Wanjun
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/12/02
dual active bridge (DAB)
unified triple-phase-shift (UTPS) control
Current stress
soft-switching
efficiency
Investigation into sand mura effects of a-IGZO TFT LCDs
期刊论文
MICROELECTRONICS RELIABILITY, 2016
Liu, Xiang
;
Hu, Hehe
;
Ning, Ce
;
Shang, Guangliang
;
Yang, Wei
;
Wang, Ke
;
Lu, Xinhong
;
Lee, Woobong
;
Wang, Gang
;
Xue, Jianshe
;
Jun, Jung Mok
;
Zhang, Shengdong
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2017/12/03
a-IGZO TFTs
LCD reliability test
Sand mura
Threshold voltage shift
Positive
Thermal gate bias stress
THIN-FILM TRANSISTORS
Charge Trapping Model for Temporal Threshold Voltage Shift in a-IGZO TFTs Considering Variations of Carrier Density in Channel and Electric Field in Gate Insulator
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2015
Wang, Lisa Ling
;
He, Hongyu
;
Liu, Xiang
;
Deng, Wei
;
Zhang, Shengdong
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2017/12/03
Channel carrier density
oxide electric field
thin-film transistors (TFTs)
threshold voltage shift
THIN-FILM TRANSISTORS
BIAS-STRESS
CONDUCTION
INSTABILITIES
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