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浏览/检索结果: 共6条，第1-6条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Photometric and Colorimetric Assessment of LED Chip Scale Packages by Using a Step-Stress Accelerated Degradation Test (SSADT) Method 期刊论文 MATERIALS, 2017, 卷号: 10 作者:  Qian, Cheng;  Fan, Jiajie;  Fang, Jiayi;  Yu, Chaohua;  Ren, Yi 收藏  |  浏览/下载：8/0  |  提交时间：2019/12/30 light-emitting diode  chip scale package  accelerated aging  step stress test  reliability qualification   Prognostics-based qualification of high-power white LEDs using Levy process approach 期刊论文 MECHANICAL SYSTEMS AND SIGNAL PROCESSING, 2017, 卷号: 82, 页码: 206-216 作者:  Yung, Kam-Chuen;  Sun, Bo;  Jiang, Xiaopeng 收藏  |  浏览/下载：2/0  |  提交时间：2019/12/30 Light-emitting diodes  Qualification  prognostics  Reliability  Anomaly detection  Levy process   Design of Reliability Qualification Test Based on Acceleration Model 会议论文 PROCEEDINGS OF THE 2015 FIRST INTERNATIONAL CONFERENCE ON RELIABILITY SYSTEMS ENGINEERING 2015 ICRSE, 2015-01-01 作者:  Yao, Jinyong;  Li, Hongzhi 收藏  |  浏览/下载：3/0  |  提交时间：2020/01/06 acceleration model  reliability qualification test  thermal cycle   Bayesian Approach to Determine the Test Plan of Reliability Qualification Test 会议论文 8th World Congress on Engineering Asset Management (WCEAM), Int Soc Engn Asset Management, Hong Kong, PEOPLES R CHINA, 2015-01-01 作者:  Yuan, Kun;  Li, Xiao-Gang 收藏  |  浏览/下载：2/0  |  提交时间：2020/01/06 Reliability qualification test  Reliability growth  Bayesian analysis  New Dirichlet distribution  Test plan determination   Simulation test system of CCD signal processor based on FPGA (EI CONFERENCE) 会议论文 2nd International Conference on Mechatronics and Applied Mechanics, ICMAM 2012, December 8, 2012 - December 9, 2012, Taiwan Zhang D.; Liu D.-B. 收藏  |  浏览/下载：27/0  |  提交时间：2013/03/25 Simulation test system of CCD signal processor based on FPGA is proposed. Field-programmable gate array (FPGA) is applied as control processing core and used in the aerospace upgrade screening of industrial grade signal processor. The system functional composition and working principle were introduced in detail. Actually evaluation and testing system was completed with integrating the forty signal processor in a single board. The system has been successfully applied in the dynamic build-in screening test of industrial grade signal processor XRD98L63  the system work stably and reliability. Test result is zero on the nonconforming product rate  satisfying the qualification that single batch screening nonconforming rate is less than 5%  build-in screening of industrial grade components for the space load applications is implemented. (2013) Trans Tech Publications  Switzerland.   Quality and Reliability of Digital Soft IP Core and a ualification Framework (CPCI-S收录) 会议论文 2011 INTERNATIONAL CONFERENCE ON QUALITY, RELIABILITY, RISK, MAINTENANCE, AND SAFETY ENGINEERING (ICQR2MSE) 作者:  Wang, Li-Wei[1];  Luo, Hong-Wei 收藏  |  浏览/下载：0/0  |  提交时间：2019/04/15 intellectual property core  quality  reliability  qualification