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清华大学 [6]

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	Performance Enhancement of Inverted Perovskite Solar Cells Based on Smooth and Compact PC61BM:SnO2 Electron Transport Layers 期刊论文 ACS APPLIED MATERIALS & INTERFACES, 2018, 卷号: 10, 期号: 23, 页码: 20128-20135 作者: Wang, Yao; Duan, Chenghao; Li, Jiangsheng; Han, Wei; Zhao, Min 收藏 \| 浏览/下载：37/0 \| 提交时间：2018/12/21 SnO2 perovskite solar cell inverted structure electron traps device stability
	Effect of traps on DC surface flashover characteristics of polymer in vacuum 会议论文作者: Zhang, Zhenjun; Li, Jie; Wang, Hui; Wang, Bin; Jiang, Wu 收藏 \| 浏览/下载：12/0 \| 提交时间：2019/11/19 Charge carriers mobility Metal-vacuum interfaces Secondary electron emissions Space-charge accumulation Surface flashover Surface flashover performance Thermally stimulated current methods traps
	Study on the trap properties of nano-ZnO modified polyimide based on surface potential decay method 会议论文作者: Zhang, Bo; Wu, Jiang; Zheng, Xiao-Quan 收藏 \| 浏览/下载：8/0 \| 提交时间：2019/11/26 Electron trap levels Modified polyimides research methods Shallow traps Space environment Surface charging Surface potential decays Trap properties
	Theoretical characterization on the size-dependent electron and hole trapping activity of chloride-passivated CdSe nanoclusters. 期刊论文 Journal of Chemical Physics, 2018, 卷号: Vol.148 No.13, 页码: 1 作者: Cui, YQ; Cui, XH; Zhang, L; Xie, YJ; Yang, ML 收藏 \| 浏览/下载：5/0 \| 提交时间：2019/02/25 ELECTRON traps MOLECULAR clusters CADMIUM selenide LIGANDS PASSIVATION *SEMICONDUCTOR quantum dots
	Study of Interface Traps in AlGaN/GaN MISHEMTs Using LPCVD SiNx as Gate Dielectric 期刊论文 IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017, 卷号: 64, 页码: 824-831 作者: Lu, Xing; Yu, Kun; Jiang, Huaxing; Zhang, Anping; Lau, Kei May 收藏 \| 浏览/下载：6/0 \| 提交时间：2019/11/26 low pressure chemical vapor deposition (LPCVD) SiNx interface traps current collapse passivation AlGaN/GaN MIS high electron mobility transistors (MISHEMTs)
	Low-Frequency Noise in High-Mobility a-InGaZnO/InSnO Nanowire Composite Thin-Film Transistors 期刊论文 IEEE Electron Device Letters, 2017, 卷号: Vol.38 No.11, 页码: 1540-1542 作者: Wan, D; Abliz, A; Su, M; Liu, CS; Jiang, CZ 收藏 \| 浏览/下载：4/0 \| 提交时间：2019/12/31 Indium tin oxide Thin film transistors Iron 1/f noise Electron traps Logic gates Fluctuations Amorphous indium-gallium-zinc-oxide (a-InGaZnO) indium-tin-oxide (ITO) nanowire (NW) thin-film transistors (TFTs) low-frequency noise (LFN) 1/f noise model
	Realistic Trap Configuration Scheme With Fabrication Processes in Consideration for the Simulations of AlGaN/GaN MIS-HEMT Devices 会议论文作者: Sun, Ruize; Liang, Yung C.; Yeo, Yee-Chia; Wang, Yun-Hsiang; Zhao, Cezhou 收藏 \| 浏览/下载：4/0 \| 提交时间：2019/12/02 GaN HEMT simulations AlGaN/GaN metal-insulator-semiconductor high-electron mobility transistor (MIS-HEMT) interfacial traps
	Investigation of the interface traps and current collapse in LPCVD SiNx/AlGaN/GaN MISHEMTs 会议论文作者: Yu, Kun; Liu, Chao; Jiang, Huaxing; Lu, Xing; Lau, Kei May 收藏 \| 浏览/下载：7/0 \| 提交时间：2019/11/26 AlGaN/GaN MIS-HEMTs Current collapse I-V measurements Interface traps LPCVD SiNx Metal insulator semiconductor high electron mobility transistors (MISHEMT) Passivation layer Plasma enhanced chemical vapor depositions (PE CVD)
	Surface Flashover Characteristics in Polyimide/ZnO Nanocomposite under dc Voltage in Vacuum 期刊论文 IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2015, 卷号: 22, 期号: [db:dc_citation_issue], 页码: 2951-2957 作者: Zhang, Zhenjun; Zheng, Xiaoquan; Jin, Yang; Wu, Jiang; Wu, Wenbin 收藏 \| 浏览/下载：3/0 \| 提交时间：2019/12/02 Flashover space charge gas desorption traps secondary electron emission
	Electrical and physical properties of 4H-SiC MOS interface with electron cyclotron resonance microwave nitrogen plasma post-oxidation annealing 期刊论文 PHYSICA B-CONDENSED MATTER, 2014, 卷号: 432, 页码: 89-95 作者: Zhu, Qiaozhi; Qin, Fuwen; Li, Wenbo; Wang, Dejun 收藏 \| 浏览/下载：4/0 \| 提交时间：2019/12/09 SiC SiO2/SiC interface Electron cyclotron resonance microwave nitrogen plasma post-oxidation annealing Density of interface traps Secondary ion mass spectrometry X-ray photoelectron spectroscopy

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