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清华大学 [14]
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期刊论文 [41]
会议论文 [25]
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Reliability Evaluation and Analysis of FPGA-Based Neural Network Acceleration System
期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2021, 卷号: 29, 期号: 3, 页码: 472-484
作者:
Xu, Dawen
;
Zhu, Ziyang
;
Liu, Cheng
;
Wang, Ying
;
Zhao, Shuang
收藏
  |  
浏览/下载:14/0
  |  
提交时间:2021/12/01
Neural networks
Circuit faults
Hardware
Acceleration
Reliability
Analytical models
Computational modeling
Integrated circuit reliability
reliability
A Single Gate Driver Based Solid-State Circuit Breaker Using Series Connected SiC MOSFETs
期刊论文
IEEE Transactions on Power Electronics, 2019, 卷号: 34, 页码: 2002-2006
作者:
Ren, Yu
;
Yang, Xu
;
Zhang, Fan
;
Wang, Fei
;
Tolbert, Leon M.
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  |  
浏览/下载:33/0
  |  
提交时间:2019/11/19
Gate drivers
Integrated circuit reliability
MOS-FET
Series connections
SiC MOSFET
Solid State Circuit Breaker
Voltage balancing
Wide band gap devices
A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application
期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2019, 卷号: Vol.66 No.2, 页码: 287-291
作者:
Fang, Xiangsheng
;
Zhang, Jiliang
;
Cui, Jie
;
Huang, Zhengfeng
;
Yang, Kang
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  |  
浏览/下载:41/0
  |  
提交时间:2019/04/24
Circuit
reliability
radiation
hardening
soft
error
double-node
upset
single
node
upset
A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application
期刊论文
IEEE Transactions on Circuits and Systems II: Express Briefs, 2019, 卷号: Vol.66 No.2, 页码: 287-291
作者:
Aibin Yan
;
Kang Yang
;
Zhengfeng Huang
;
Jiliang Zhang
;
Jie Cui
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2019/12/13
Latches
Radiation hardening (electronics)
Clocks
Feedback loop
Power dissipation
Reliability
Electronic mail
Circuit reliability
radiation hardening
soft error
double-node upset
single node upset
A New Differential Backup Protection Strategy for Smart Distribution Networks: A Fast and Reliable Approach
期刊论文
IEEE Access, 2019, 卷号: Vol.7, 页码: 38135-38145
作者:
Wenguo Li
;
Yi Tan
;
Yong Li
;
Yijia Cao
;
Chun Chen
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2019/12/13
Circuit faults
Reliability
Circuit breakers
Transmission line measurements
Power system reliability
Power system stability
Relays
Backup protection
differential protection
device detection
distribution networks
Fault-Tolerant Control Strategies for T-Type Three-Level Inverters Considering Neutral-Point Voltage Oscillations
期刊论文
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2019, 卷号: 66, 期号: 4, 页码: 2837-2846
作者:
Chen, Jie
;
Zhang, Chenghui
;
Chen, Alian
;
Xing, Xiangyang
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2019/12/11
Fault-tolerant control
reliability
neutral-point voltage oscillations
open-circuit fault
T-type three-level inverters
A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application
期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2019, 卷号: Vol.66 No.2, 页码: 287-291
作者:
Yan, AB
;
Yang, K
;
Huang, ZF
;
Zhang, JL
;
Cui, J
收藏
  |  
浏览/下载:16/0
  |  
提交时间:2019/12/17
Circuit reliability
radiation hardening
soft error
double-node upset
single node upset
A Novel MTJ-Based Non-Volatile Ternary Content-Addressable Memory for High-Speed, Low-Power, and High-Reliable Search Operation
期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2019, 卷号: 66, 页码: 1454-1464
作者:
Wang, Chengzhi
;
Zhang, Deming
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2019/12/30
MTJ
NV-TCAM
search reliability
ultra-low power
search delay
144-bit word circuit
Integrated circuit failure analysis and reliability prediction based on physics of failure
期刊论文
ENGINEERING FAILURE ANALYSIS, 2019, 卷号: 104, 页码: 714-726
作者:
Jiao, Jian
;
De, Xinlin
;
Chen, Zhiwei
;
Zhao, Tingdi
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/12/30
Physics of failure
Reliability prediction
Simulation test
Failure analysis
Circuit board
A New Principle of HVDC Protection Based on Two-terminal Electrical Quantities
会议论文
作者:
Zhang, Xinyue
;
Kang, Xiaoning
;
Zhang, Yagang
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/11/19
DC voltage variation
Electrical quantities
External fault
High reliability
Short-circuit fault
Transition resistance
Two terminals
Voltage variation
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