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科研机构
北京航空航天大学 [5]
内容类型
期刊论文 [3]
会议论文 [2]
发表日期
2018 [4]
2017 [1]
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Effects of Voids on Mechanical and Thermal Properties of the Die Attach Solder Layer Used in High-Power LED Chip-Scale Packages
期刊论文
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2018, 卷号: 8, 页码: 1254-1262
作者:
Jiang, Chengshuo
;
Fan, Jiajie
;
Qian, Cheng
;
Zhang, Hao
;
Fan, Xuejun
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/12/30
Chip-scale package (CSP)
flip-chip die attach
high-power light-emitting diode (LED)
reliability
voids
A design and qualification of LED flip Chip-on-Board module with tunable color temperatures
期刊论文
MICROELECTRONICS RELIABILITY, 2018, 卷号: 84, 页码: 140-148
作者:
Fan, Jiajie
;
Cao, Jianwu
;
Yu, Chaohua
;
Qian, Cheng
;
Fan, Xuejun
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2019/12/30
LED
Wafer level chip scale package
Chip-on-Board
Tunable color temperatures
Luminous flux modeling
Study of ultraviolet assisted cure mechanism of the phosphor/silicone composites used in White LEDs
会议论文
2018 19TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2018-01-01
作者:
Wang, Zhen
;
Fan, Jiajie
;
Liu, Jie
;
Hu, Aihua
;
Qian, Cheng
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2019/12/30
LED
Chip scale package
Phosphor/silicone composites
Viscosity
Optimal cure process
A design and qualification of LED flip Chip-on-Board module with tunable color temperatures
会议论文
MICROELECTRONICS RELIABILITY, 2018-05-01
作者:
Fan, Jiajie
;
Cao, Jianwu
;
Yu, Chaohua
;
Qian, Cheng
;
Fan, Xuejun
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/12/30
LED
Wafer level chip scale package
Chip-on-Board
Tunable color temperatures
Luminous flux modeling
Photometric and Colorimetric Assessment of LED Chip Scale Packages by Using a Step-Stress Accelerated Degradation Test (SSADT) Method
期刊论文
MATERIALS, 2017, 卷号: 10
作者:
Qian, Cheng
;
Fan, Jiajie
;
Fang, Jiayi
;
Yu, Chaohua
;
Ren, Yi
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2019/12/30
light-emitting diode
chip scale package
accelerated aging
step stress test
reliability qualification
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