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北京航空航天大学 [39]
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期刊论文 [40]
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Insights into Oxidation of the Ultrahigh Molecular Weight Polyethylene Artificial Joint Related to Lipid Peroxidation
期刊论文
ACS Applied Bio Materials, 2020, 卷号: 3, 期号: 1, 页码: 547-553
作者:
Ren, Yue
;
Wang, Zi-Yang
;
Wei, Xin
;
Xu, Lu
;
Gul, Rizwan M.
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2021/09/06
Ultrahigh molecular weight polyethylenes
Aliphatic compounds
Arthroplasty
Atoms
Bearings (machine parts)
Diffusion in liquids
Free radical reactions
Free radicals
Joint prostheses
Lipids
Molecular weight
Oxidative stress
Oxygen
Thermooxidation
Wear resistance
Accelerated aging
Lipid peroxidation
Oxidation mechanisms
Oxidation products
Oxidative degradation
squalene
Thermo
oxidative aging
Total joint replacement
In situ Condition Monitoring of IGBT Based on Miller Plateau Duration
期刊论文
IEEE Transactions on Power Electronics, 2019, 卷号: 34, 页码: 769-782
作者:
Liu, Jingcun
;
Zhang, Guogang
;
Chen, Qian
;
Qi, Lu
;
Geng, Yingsan
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2019/11/19
Accelerated aging test
Closed-form expression
Gate oxide degradation
High electric field stress
Multiple failure mechanisms
On line measurement system
Online condition monitoring
Semiconductor device reliability
Investigation of Step-Stress Accelerated Degradation Test Strategy for Ultraviolet Light Emitting Diodes
期刊论文
MATERIALS, 2019, 卷号: 12
作者:
Liang, Banglong
;
Wang, Zili
;
Qian, Cheng
;
Ren, Yi
;
Sun, Bo
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2019/12/30
UV-LED
step-stress accelerated tests
degradation rate
failure mechanism consistency
test strategy
An Integration Method of Expert Experience and ADT Data Based on Uncertain Cross-Entropy
会议论文
Proceedings - 2018 3rd International Conference on System Reliability and Safety, ICSRS 2018, 2018-11-24
作者:
Chen, W.-B.
;
Li, X.-Y.
;
Kang, R.
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2019/12/30
Electric connectors
Entropy
Information retrieval
Integration
Integration testing
Reliability analysis
Reliability theory
Stress relaxation
Uncertainty analysis
Accelerated degradation testing
Cross entropy
Epistemic uncertainties
Expert experience
Information integration
Reliability Evaluation
Uncertainty theory
Data integration
An optimized model for lifetime prediction of LED-based light bars using luminance degradation method
期刊论文
Lighting Research and Technology, 2018, 卷号: 50, 期号: 2, 页码: 316-325
作者:
Zhang, J.P.
;
Bai, Y.F.
;
Zhang, X.
;
Chen, W.L.
;
Li, W.B.
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  |  
浏览/下载:18/0
  |  
提交时间:2020/11/14
Luminance
Weibull distribution
Accelerated stress
Lifetime estimation
Lifetime prediction
Optimized models
Test data
Test time
Weibull functions
Study on Accelerated Stress Test for Fuel Cell Lifetime
期刊论文
International Journal of Electrochemical Science, 2018, 卷号: 13, 期号: 2, 页码: 2022-2032
作者:
Tian, Tian
;
Tang, Jianjun
;
Chen, Yanan
;
Tan, Jinting*
;
Li, Shang
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  |  
浏览/下载:4/0
  |  
提交时间:2019/12/04
Accelerated stress test
Durability
ECSA
MEA
Particle size
Mechanism Equivalence in Designing Optimum Step-Stress Accelerated Degradation Test Plan Under Wiener Process
期刊论文
IEEE ACCESS, 2018, 卷号: 6, 页码: 4440-4451
作者:
Wang, Han
;
Zhao, Yu
;
Ma, Xiaobing
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2019/12/30
Degradation mechanism equivalence
M-optimality criterion
step-stress accelerated degradation test
Wiener process
Nonlinear step-stress accelerated degradation modelling considering three sources of variability
期刊论文
RELIABILITY ENGINEERING & SYSTEM SAFETY, 2018, 卷号: 172, 页码: 207-215
作者:
Hao, Songhua
;
Yang, Jun
;
Berenguer, Christophe
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2019/12/30
Step-stress accelerated degradation testing
Nonlinearity
Temporal variability
Unit-to-unit variability
Measurement errors
GA-SIMEX
Bayesian step stress accelerated degradation testing design: A multi-objective Pareto-optimal approach
期刊论文
RELIABILITY ENGINEERING & SYSTEM SAFETY, 2018, 卷号: 171, 页码: 9-17
作者:
Li, Xiaoyang
;
Hu, Yuqing
;
Zhou, Jiandong
;
Li, Xiang
;
Kang, Rui
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2019/12/30
Reliability
Bayesian optimal design
Step stress accelerated degradation testing
Multi objective programming
NSGA II
DEA
An Alternative Lifetime Model for White Light Emitting Diodes under Thermal-Electrical Stresses
期刊论文
MATERIALS, 2018, 卷号: 11, 页码: 1-11
作者:
Yang, Xi
;
Sun, Bo
;
Wang, Zili
;
Qian, Cheng
;
Ren, Yi
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/12/30
lifetime prediction
light emitting diodes
thermal stress
electrical stress
accelerated degradation test
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