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Guidelines for the use and interpretation of assays for monitoring autophagy (4th edition)
期刊论文
AUTOPHAGY, 2021, 卷号: 17
作者:
Klionsky, Daniel J.
;
Abdel-Aziz, Amal Kamal
;
Abdelfatah, Sara
;
Abdellatif, Mahmoud
;
Abdoli, Asghar
收藏
  |  
浏览/下载:279/0
  |  
提交时间:2021/05/31
Autophagosome
cancer
flux
LC3
lysosome
macroautophagy
neurodegeneration
phagophore
stress
vacuole
Architectural Exploration to Address the Reliability Challenges for ReRAM-Based Buffer in SSD
期刊论文
IEEE Transactions on Circuits and Systems I: Regular Papers, 2019, 卷号: 66, 页码: 226-238
作者:
Zhao, Xiaoqing
;
Sun, Hongbin
;
Liu, Longjun
;
Yang, Yang
;
Dai, Liangliang
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2019/11/19
Address mappings
Efficiency improvement
Efficient architecture
Non-volatile memory
Prototypes
Quantitative evaluation
Random bit errors
Solid state drives
Bringing the Functionality of Tag Sampling to Reality for COTS RFID Systems
期刊论文
IEEE COMMUNICATIONS LETTERS, 2019, 卷号: 23, 页码: 1254-1258
作者:
Hu, Qiwen
;
Xie, Xin
;
Liu, Xiulong
;
Li, Keqiu
;
Wu, Jie
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2019/12/02
RFID
TDMA
C1G2 standard
tag sampling
Architectural Exploration to Address the Reliability Challenges for ReRAM-Based Buffer in SSD
期刊论文
IEEE Transactions on Circuits and Systems I: Regular Papers, 2019, 卷号: Vol.66 No.1, 页码: 226-238
作者:
Xiaoqing Zhao
;
Liangliang Dai
;
Nanning Zheng
;
Xiulong Wu
;
Yang Yang
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2019/04/24
Reliability
Nonvolatile
memory
Prototypes
Bit
error
rate
Computer
architecture
Transistors
Sun
ReRAM
solid
state
drive
reliability
endurance
bit
error
rate
Radiation-Hardened 14T SRAM Bitcell With Speed and Power Optimized for Space Application
期刊论文
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2019, 卷号: Vol.27 No.2, 页码: 407-415
作者:
Changyong Liu
;
Xiulong Wu
;
Zhiting Lin
;
Junning Chen
;
Jiati Huang
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2019/04/24
Architectural Exploration to Address the Reliability Challenges for ReRAM-Based Buffer in SSD
期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2019, 卷号: Vol.66 No.1, 页码: 226-238
作者:
Zheng, Nanning
;
Liu, Longjun
;
Yang, Yang
;
Wu, Xiulong
收藏
  |  
浏览/下载:11/0
  |  
提交时间:2019/04/24
ReRAM
solid
state
drive
reliability
endurance
bit
error
rate
Suppression of Filament Overgrowth in Conductive Bridge Random Access Memory by TaO/TaO Bi-Layer Structure.
期刊论文
Nanoscale research letters, 2019, 卷号: Vol.14 No.1, 页码: 111
作者:
Danian Dong
;
Xiulong Wu
;
Tiancheng Gong
;
Ming Liu
;
Hangbing Lv
收藏
  |  
浏览/下载:39/0
  |  
提交时间:2019/04/24
Bi-layer structure
CMOS-compatible process
Conductive bridge resistive switching memory
Reliability
Architectural Exploration to Address the Reliability Challenges for ReRAM-Based Buffer in SSD
期刊论文
IEEE Transactions on Circuits and Systems I: Regular Papers, 2019, 卷号: Vol.66 No.1, 页码: 226-238
作者:
Zhao, Xiaoqing
;
Sun, Hongbin
;
Liu, Longjun
;
Yang, Yang
;
Dai, Liangliang
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/12/17
Address mappings
Efficiency improvement
Efficient architecture
Non-volatile memory
Prototypes
Quantitative evaluation
Random bit errors
Solid state drives
Architectural Exploration to Address the Reliability Challenges for ReRAM-Based Buffer in SSD
期刊论文
IEEE Transactions on Circuits and Systems I: Regular Papers, 2019, 卷号: Vol.66 No.1, 页码: 226-238
作者:
Xiaoqing Zhao
;
Hongbin Sun
;
Longjun Liu
;
Yang Yang
;
Liangliang Dai
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/12/13
Reliability
Nonvolatile
memory
Prototypes
Bit
error
rate
Computer
architecture
Transistors
Sun
ReRAM
solid
state
drive
reliability
endurance
bit
error
rate
Architectural Exploration to Address the Reliability Challenges for ReRAM-Based Buffer in SSD
期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2019, 卷号: Vol.66 No.1, 页码: 226-238
作者:
Zhao, Xiaoqing
;
Sun, Hongbin
;
Liu, Longjun
;
Yang, Yang
;
Dai, Liangliang
收藏
  |  
浏览/下载:12/0
  |  
提交时间:2019/12/17
ReRAM
solid
state
drive
reliability
endurance
bit
error
rate
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