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浏览/检索结果: 共1条，第1-1条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Self-heating burn-in pattern generation based on the genetic algorithm incorporated with a BACK-like procedure 期刊论文 IET COMPUTERS AND DIGITAL TECHNIQUES, 2015 Cheng, Zuolin; Cui, Xiaole; Cui, Xiaoxin; Lee, Chung Len 收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03 circuit testing  divide and conquer methods  electronic engineering computing  genetic algorithms  self-heating burn-in pattern generation  genetic algorithm  BACK-like procedure  integrated circuit  uniform node transition  multistep strategy  transition measure  backtracing  target patterns  maximal transition count  maximal power dissipation  pattern sequence  divide-and-conquer strategy  IC burn-in application  POWER ESTIMATION  SATISFIABILITY