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Effect of gate-source spacing on parasitic source access resistance in AlGaN/GaN heterostructure field-effect transistors
期刊论文
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2018, 卷号: 124, 期号: 5
作者:
Cui, Peng
;
Lin, Zhaojun
;
Fu, Chen
;
Liu, Yan
;
Lv, Yuanjie
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/12/11
Effect of gate-source spacing on parasitic source access resistance in AlGaN/GaN heterostructure field-effect transistors
期刊论文
Applied Physics A: Materials Science and Processing, 2018, 卷号: 124, 期号: 5
作者:
Cui, Peng
;
Lin, Zhaojun
;
Fu, Chen
;
Liu, Yan
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/12/11
Source-drain resistance characteristics of back-channel etched amorphous InGaZnO thin film transistors with TiO2:Nb protective layer
期刊论文
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2017
Zhang, Letao
;
Zhou, Xiaoliang
;
Chang, Baozhu
;
Wang, Longyan
;
Xiao, Yuxiang
;
He, Hongyu
;
Zhang, Shengdong
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2017/12/03
Amorphous indium gallium zinc oxide
Thin film transistors
Source-drain parasitic resistance
TiO2:Nb
Films thickness
THRESHOLD VOLTAGE
ANATASE TIO2
PERFORMANCE
SHIFT
TFTS
Nb Doped TiO2 Protected Back-Channel-Etched Amorphous InGaZnO Thin Film Transistors
期刊论文
IEEE ELECTRON DEVICE LETTERS, 2017
Zhang, Letao
;
Zhou, Xiaoliang
;
Yang, Huan
;
He, Hongyu
;
Wang, Longyan
;
Zhang, Min
;
Zhang, Shengdong
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
Amorphous indium gallium zinc oxide (a-IGZO)
thin film transistors (TFTs)
back-channel-etch (BCE) process
Nb doped TiO2
THRESHOLD VOLTAGE
CARBON-NANOFILM
BARRIER LAYER
PERFORMANCE
SHIFT
Influence of Different Gate Biases and Gate Lengths on Parasitic Source Access Resistance in AlGaN/GaN Heterostructure FETs
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017, 卷号: 64, 期号: 3, 页码: 1038-1044
作者:
Cui, Peng
;
Liu, Huan
;
Lin, Wei
;
Lin, Zhaojun
;
Cheng, Aijie
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/12/11
AlGaN/GaNheterostructureFETs (HFETs)
gate bias
gate length
parasitic
source access resistance
polarization Coulomb field scattering
Parasitic source resistance at different temperatures for AlGaN/AlN/GaN heterostructure field-effect transistors
期刊论文
CHINESE PHYSICS B, 2017, 卷号: 26, 期号: 9
作者:
Liu, Yan
;
Lin, Zhao-Jun
;
Lv, Yuan-Jie
;
Cui, Peng
;
Fu, Chen
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/12/11
AlGaN/AlN/GaN heterostructure field-effect transistors (HFETs)
parasitic source resistance
polarization Coulomb field scattering
Parasitic source resistance at different temperatures for AlGaN/AlN/GaN heterostructure field-effect transistors
期刊论文
Chinese Physics B, 2017, 期号: 09, 页码: 393-399
作者:
Liu Y(刘艳)
;
Lin ZJ(林兆军)
;
Lv YJ(吕元杰)
;
Cui P(崔鹏)
;
Fu C(付晨)
收藏
  |  
浏览/下载:13/0
  |  
提交时间:2019/12/12
Al Ga N/Al N/Ga N heterostructure field-effect transistors(HFETs)
parasitic source resistance
polarization Coulomb field scattering
FOI FinFET with Ultra-low Parasitic Resistance Enabled by Fully Metallic Source and Drain Formation on Isolated Bulk-Fin
会议论文
作者:
Wu ZH(吴振华)
;
Luo J(罗军)
;
Meng LK(孟令款)
;
Zhang QZ(张青竹)
;
Li YD(李昱东)
收藏
  |  
浏览/下载:32/0
  |  
提交时间:2017/05/19
Sn-doped ZnO thin-film transistors with AZO, TZO and Al heterojunction source/drain contacts
期刊论文
ELECTRONICS LETTERS, 2016
Zhang, Yi
;
Han, Dedong
;
Huang, Lingling
;
Dong, Junchen
;
Cong, Yingying
;
Cui, Guodong
;
Zhang, Xiaomi
;
Zhang, Xing
;
Zhang, Shengdong
;
Wang, Yi
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/03
thin film transistors
electrical contacts
tin
zinc compounds
indium compounds
tin compounds
tin-doped zinc oxide thin-film transistors
heterojunction source-drain contacts
bottom gate
top contact thin-film transistors
glass substrate
indium tin oxide thin films
alumni zinc oxide thin films
AZO thin films
aluminium thin films
AZO S-D electrode
saturation mobility
subthreshold slope
on-off current ratio
output characteristic
parasitic resistance
contact performance
t
Effect of Polarization Coulomb Field Scattering on Parasitic Source Access Resistance and Extrinsic Transconductance in AlGaN/GaN Heterostructure FETs
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016, 卷号: 63, 期号: 4, 页码: 1471-1477
作者:
Yang, Ming
;
Lin, Zhaojun
;
Zhao, Jingtao
;
Cui, Peng
;
Fu, Chen
收藏
  |  
浏览/下载:9/0
  |  
提交时间:2019/12/16
AlGaN/GaN heterostructure FETs (HFETs)
extrinsic transconductance
parasitic source access resistance
polarization Coulomb field (PCF)
scattering
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