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130nm部分耗尽绝缘体上硅工艺晶体管总剂量效应及模型研究 学位论文
中国科学院新疆理化技术研究所: 中国科学院大学, 2019
作者:  席善学
收藏  |  浏览/下载:12/0  |  提交时间:2019/07/15
Characterization of 1.2 kV 4H-SiC power MOSFETs and Si IGBTs at cryogenic and high temperatures 会议论文
作者:  Tian, Kai;  Qi, Jinwei;  Mao, Zhangsong;  Yang, Song;  Song, Wenjie
收藏  |  浏览/下载:6/0  |  提交时间:2019/11/19
New method of total ionizing dose compact modeling in partially depleted silicon-on-insulator mosfets 期刊论文
Chinese physics letters, 2016, 卷号: 33, 期号: 7, 页码: 4
作者:  Huang, Jian-Qiang;  He, Wei-Wei;  Chen, Jing;  Luo, Jie-Xin;  Lu, Kai
收藏  |  浏览/下载:24/0  |  提交时间:2019/05/09
Investigation of Self-heating Effect in SOI-LDMOS by Device Simulation 其他
2012-01-01
Lun, Zhiyuan; Du, Gang; Qin, Jieyu; Wang, Yijiao; Wang, Juncheng; Liu, Xiaoyan
收藏  |  浏览/下载:5/0  |  提交时间:2015/11/13
Reactive Ion Etching of Germanium Using SF6/CHF3/He gas mixture 其他
2012-01-01
Li, Min; Lin, Meng; Yun, Quanxin; Li, Zhiqiang; An, Xia; Li, Ming; Zhang, Xing; Huang, Ru
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
Investigation of the OFF-State Behavior in Deep-Submicrometer NMOSFETs Under Heavy-Ion Irradiation by 3-D Simulation 期刊论文
2011
Xue, Shoubin; Wang, Pengfei; Huang, Ru; Zhang, Xing
收藏  |  浏览/下载:5/0  |  提交时间:2015/11/10
Physical-Based Threshold Voltage and Mobility Models Including Shallow Trench Isolation Stress Effect on nMOSFETs 期刊论文
ieee 纳米技术汇刊, 2011
Wu, Wei; Du, Gang; Liu, Xiaoyan; Sun, Lei; Kang, Jinfeng; Han, Ruqi
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/10
A compact Force Sensor with Low Temperature Drift Design Using a Standard CMOS Process 会议论文
5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010
作者:  Benxian Peng;  Ting Yu;  Fengqi Yu;  Yuchun Feng
收藏  |  浏览/下载:9/0  |  提交时间:2015/08/21
Strain Stability and Carrier Mobility Enhancement in Strained Si on Relaxed SiGe-on-Insulator 期刊论文
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2010, 卷号: 157, 期号: 1, 页码: H104-H108
Ma, XB; Liu, WL; Liu, XY; Du, XF; Song, ZT; Lin, CL; Chu, PK
收藏  |  浏览/下载:15/0  |  提交时间:2012/03/24
Impact of proton-radiation-induced spacer damage on the dc characteristics degradation in deep-submicron metal-oxide-semiconductor field effect transistors 期刊论文
应用物理杂志, 2009
Xue, Shoubin; Huang, Ru; Wang, Pengfei; Wang, Wenhua; Wu, Dake; Pei, Yunpeng; Zhang, Xing
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/10


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