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CORC

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Simulation study on single-event burnout in field-plated Ga2O3 MOSFETs 期刊论文
MICROELECTRONICS RELIABILITY, 2023, 卷号: 149
作者:  Yu, Cheng-hao;  Guo, Hao-min;  Liu, Yan;  Wu, Xiao-dong;  Zhang, Li-long
收藏  |  浏览/下载：11/0  |  提交时间：2023/11/10
DNA intercalation makes possible superior-gain organic photoelectrochemical transistor detection 期刊论文
BIOSENSORS & BIOELECTRONICS, 2023, 卷号: 237, 页码: 6
作者:  Zhu, Yu-Yue;  Jiang, Tian-Tong;  Gao, Ge;  Wang, Shi-Liang;  Jiang, Xing-Wu
收藏  |  浏览/下载：12/0  |  提交时间：2023/12/13
A SiC asymmetric cell trench MOSFET with a split gate and integrated p(+)-poly Si/SiC heterojunction freewheeling diode 期刊论文
CHINESE PHYSICS B, 2023, 卷号: 32, 期号: 5, 页码: 8
作者:  Jiang, Kaizhe;  Zhang, Xiaodong;  Tian, Chuan;  Zhang, Shengrong;  Zheng, Liqiang
收藏  |  浏览/下载：9/0  |  提交时间：2023/10/07
The effect of nonideal boundary condition on instability of THz plasma waves in quantum field-effect transistors 期刊论文
AIP Advances, 2022, 卷号: 12, 期号: 3
作者:  Zhang, Li-Ping;  Liu, Chen-Xiao;  Feng, Jiang-Xu;  Su, Jun-Yan
收藏  |  浏览/下载：17/0  |  提交时间：2022/04/21
Optogenetically engineered cell-based graphene transistor for pharmacodynamic evaluation of anticancer drugs 期刊论文
Sensors and Actuators B: Chemical, 2022, 卷号: 358, 页码: 1-11
作者:  Yang J(杨佳);  Li GX(李恭新);  Zu LP(祖立鹏);  Wang WX(王文学);  Ge ZX(葛治星)
收藏  |  浏览/下载：28/0  |  提交时间：2022/03/07
Two-dimensional reconfigurable electronics enabled by asymmetric floating gate 期刊论文
Nano Research, 2022, 卷号: 15, 期号: 5, 页码: 4439-4447
作者:  T. Y. Jin;  J. Gao;  Y. A. Wang;  Y. Zheng;  S. Sun
收藏  |  浏览/下载：5/0  |  提交时间：2023/06/14
Electrical and Optoelectrical Dual-Modulation in Perovskite-Based Vertical Field-Effect Transistors 期刊论文
Acs Photonics, 2022, 页码: 10
作者:  Y. T. Zou;  Y. R. Shi;  B. Wang;  M. X. Liu;  J. R. An
收藏  |  浏览/下载：2/0  |  提交时间：2023/06/14
A Charge Density Model of Silicon-nanowire GAA MOSFET Incoroperating the Source-drian Tunneling Effect for IC Design 会议论文
Guilin, China, June 4-6, 2021
作者:  Cheng H(程贺);  Zhang C(张超);  Liu TF(刘铁锋);  Xie C(谢闯);  Yang ZJ(杨志家)
收藏  |  浏览/下载：11/0  |  提交时间：2022/02/04
The open-pin failure of power device under the combined effect of thermo-migration and electro-migration 期刊论文
Chinese Science Bulletin, 2020, 卷号: 65, 期号: 20, 页码: 2169-2177
作者:  Gao Liyin;  Li Caifu;  Cao Lihua;  Liu Zhiquan
收藏  |  浏览/下载：15/0  |  提交时间：2021/02/03
The influence of channel width on total ionizing dose responses of the 130 nm H-gate partially depleted SOI NMOSFETs 期刊论文
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2020, 卷号: 175, 期号: 5-6, 页码: 551-558
作者:  Xi, SX (Xi, Shan-Xue)[ 1,2,3 ];  Zheng, QW (Zheng, Qi-Wen)[ 1,2 ];  Lu, W (Lu, Wu)[ 1,2 ];  Cui, JW (Cui, Jiang-Wei)[ 1,2 ];  Wei, Y (Wei, Ying)[ 1,2 ]
收藏  |  浏览/下载：24/0  |  提交时间：2020/07/06

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