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CORC

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Simulation study on single-event burnout in field-plated Ga2O3 MOSFETs 期刊论文
MICROELECTRONICS RELIABILITY, 2023, 卷号: 149
作者:  Yu, Cheng-hao;  Guo, Hao-min;  Liu, Yan;  Wu, Xiao-dong;  Zhang, Li-long
收藏  |  浏览/下载：14/0  |  提交时间：2023/11/10
Radiation Effects and Mechanisms on Switching Characteristics of Silicon Carbide Power MOSFETs 期刊论文
JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, 2021, 卷号: 16, 期号: 9, 页码: 1423-1429
作者:  Feng, HN (Feng, Haonan) [1] , [2] , [3];  Yang, S (Yang, Sheng) [1] , [2] , [3];  Liang, XW (Liang, Xiaowen) [1] , [2] , [3];  Zhang, D (Zhang, Dan) [1] , [2] , [3];  Pu, XJ (Pu, Xiaojuan) [1] , [2] , [3]
收藏  |  浏览/下载：45/0  |  提交时间：2022/03/24
Three-Dimensional Mechanistic Modeling of Gate Leakage Current in High- κ MOSFETs 期刊论文
PHYSICAL REVIEW APPLIED, 2020, 卷号: 13, 期号: 2, 页码: 024020
作者:  Feilong Liu;   Yue-Yang Liu;   Ling Li;   Guofu Zhou;   Xiangwei Jiang;   Jun-Wei Luo
收藏  |  浏览/下载：27/0  |  提交时间：2021/11/30
Nanowire gate-all-around MOSFETs modeling: ballistic transport incorporating the source-to-drain tunneling 期刊论文
Japanese Journal of Applied Physics, 2020, 卷号: 59, 期号: 7, 页码: 1-9
作者:  Cheng H(程贺);  Liu TF(刘铁锋);  Zhang C(张超);  Liu ZF(刘志峰);  Yang ZJ(杨志家)
收藏  |  浏览/下载：19/0  |  提交时间：2020/07/11
A Single Gate Driver Based Solid-State Circuit Breaker Using Series Connected SiC MOSFETs 期刊论文
IEEE Transactions on Power Electronics, 2019, 卷号: 34, 页码: 2002-2006
作者:  Ren, Yu;  Yang, Xu;  Zhang, Fan;  Wang, Fei;  Tolbert, Leon M.
收藏  |  浏览/下载：36/0  |  提交时间：2019/11/19
High-k Spacer Consideration of Ultrascaled Gate-All-Around Junctionless Transistor in Ballistic Regime 期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2018, 卷号: 65, 期号: 12, 页码: 5282-5288
作者:  Yang YM(杨育梅)
收藏  |  浏览/下载：9/0  |  提交时间：2020/11/13
High-k Spacer Consideration of Ultrascaled Gate-All-Around Junctionless Transistor in Ballistic Regime 期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2018, 卷号: 65, 期号: 12, 页码: 5282-5288
作者:  Yang, Yumei;  Lou, Haijun;  Lin, Xinnan
收藏  |  浏览/下载：10/0  |  提交时间：2019/11/15
半导体器件的制造方法 专利
专利号: US9899270, 申请日期: 2018-02-20, 公开日期: 2014-06-05
作者:  徐秋霞;  朱慧珑;  许高博;  周华杰;  梁擎擎
收藏  |  浏览/下载：17/0  |  提交时间：2019/03/27
The impact of heat loss paths on the electrothermal models of self-heating effects in nanoscale tri-gate SOI MOSFETs 期刊论文
IEICE ELECTRONICS EXPRESS, 2018, 卷号: 15
作者:  Su, Yali;  Lai, Junhua;  Liang, Feng
收藏  |  浏览/下载：2/0  |  提交时间：2019/11/26
An Integrated Gate Driver with Active Delay Control Method for Series Connected SiC MOSFETs 期刊论文
2018 IEEE 19th Workshop on Control and Modeling for Power Electronics, COMPEL 2018, 2018
作者:  Wang, Panrui;  Gao, Feng;  Jing, Yang;  Hao, Quanrui;  Li, Kejun
收藏  |  浏览/下载：9/0  |  提交时间：2019/12/11

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