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科研机构
半导体研究所 [8]
高能物理研究所 [2]
内容类型
期刊论文 [9]
会议论文 [1]
发表日期
2003 [3]
2002 [2]
2001 [4]
1985 [1]
学科主题
半导体材料 [2]
半导体物理 [2]
Physics [1]
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Hydrogen related defects in neutron-irradiated silicon grown in hydrogen ambient
期刊论文
Microelectronic engineering, 2003, 卷号: 66, 期号: 1-4, 页码: 333-339
作者:
Wang, QY
;
Wang, JH
;
Deng, HF
;
Lin, LY
收藏
  |  
浏览/下载:19/0
  |  
提交时间:2019/05/12
Neutron irradiation
Annealing
Defects in silicon
Hydrogen related defects in neutron-irradiated silicon grown in hydrogen ambient
期刊论文
microelectronic engineering, 2003, 卷号: 66, 期号: 1-4, 页码: 333-339
Wang QY
;
Wang JH
;
Deng HF
;
Lin LY
收藏
  |  
浏览/下载:47/0
  |  
提交时间:2010/08/12
neutron irradiation
annealing
defects in silicon
SPECTRA
Hydrogen related defects in neutron-irradiated silicon grown in hydrogen ambient
会议论文
iumrs/icem 2002 conference, xian, peoples r china, jun 10-14, 2002
Wang QY
;
Wang JH
;
Deng HF
;
Lin LY
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2010/11/15
neutron irradiation
annealing
defects in silicon
SPECTRA
X-ray optics 'owl' and 'trinity'
期刊论文
Japanese journal of applied physics part 1-regular papers short notes & review papers, 2002, 卷号: 41, 期号: 7a, 页码: 4742-4749
作者:
Ando, M
;
Hyodo, K
;
Sugiyama, H
;
Maksimenko, A
;
Pattanasiriwisawa, W
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2019/04/23
X-ray dark-field imaging
Asymmetric reflection monochromator
Analyzer
Refraction contrast
X-ray bright-field imaging
Vertical wiggler
Synchrotron x-radiation
Fz grown silicon
Crystal diffraction index
Crystal thickness
X-ray optics 'Owl' and 'Trinity'
期刊论文
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2002, 卷号: 41, 期号: 7A, 页码: 4742-4749
作者:
Ando, M
;
Hyodo, K
;
Sugiyama, H
;
Maksimenko, A
;
Pattanasiriwisawa, W
收藏
  |  
浏览/下载:35/0
  |  
提交时间:2016/06/29
X-ray dark-field imaging
asymmetric reflection monochromator
analyzer
refraction contrast
X-ray bright-field imaging
vertical wiggler
synchrotron X-radiation
Fz grown silicon
crystal diffraction index
crystal thickness
Infrared study on the oxygen precipitation in floating-zone silicon grown in hydrogen ambience
期刊论文
Rare metal materials and engineering, 2001, 卷号: 30, 页码: 568-571
作者:
Li, HX
;
Li, CB
;
Xue, CS
;
Diao, ZY
;
Chen, LS
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2019/05/12
Oxygen precipitates
Silicon
Infrared spectrum
Oxygen precipitation in floating-zone silicon grown in hydrogen ambience and its application
期刊论文
Materials science and engineering b-solid state materials for advanced technology, 2001, 卷号: 83, 期号: 1-3, 页码: 106-110
作者:
Li, HX
;
Li, CB
;
He, YJ
;
Liu, GR
;
Chen, YS
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2019/05/12
Oxygen precipitates
Silicon
Ntd
Denuded zone
Photoluminescence properties of porous silicon based on fz(h) si wafer
期刊论文
Rare metals, 2001, 卷号: 20, 期号: 1, 页码: 38-+
作者:
He, YJ
;
Li, HX
;
Guo, CH
;
Liu, GR
;
Chen, YS
收藏
  |  
浏览/下载:21/0
  |  
提交时间:2019/05/12
Porous silicon
Photoluminescence
Surface modification
Rapid thermal oxidation
The transition from Eu3+ to Eu2+ in SiO2(Eu) thin films prepared by ion implantation and co-sputtering
期刊论文
acta physica sinica, 2001, 卷号: 50, 期号: 3, 页码: 532-535
Liu FZ
;
Zhu MF
;
Liu T
;
Li BC
收藏
  |  
浏览/下载:165/50
  |  
提交时间:2010/08/12
SiO2(Eu) films
XANES
SPECTROSCOPY
SILICON
VALENCE
GLASS
ER3+
THE CONVERGENT EFFECT OF THE ANNEALING TEMPERATURES OF ELECTRON-IRRADIATED DEFECTS IN FZ SILICON GROWN IN HYDROGEN
期刊论文
solid state communications, 1985, 卷号: 53, 期号: 11, 页码: 975-978
QIN GG
;
HUA ZL
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2010/11/15
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