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Facile usage of a MYTHEN 1K with a Huber 5021 diffractometer and angular calibration in operando experiments 期刊论文
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2016, 卷号: 49, 页码: 1182-1189
作者:  Gao, M;  Gu, YL;  Li, L;  Gong, ZL;  Gao, XY
收藏  |  浏览/下载:21/0  |  提交时间:2017/03/02
X-Ray diffraction determination of the fractions of hexagonal and twinned phases in cubic GaN layers grown on (001)GaAs substrate 期刊论文
thin solid films, 2001, 卷号: 392, 期号: 1, 页码: 29-33
Qu B; Zheng XH; Wang YT; Feng ZH; Liu SA; Lin SM; Yang H; Liang JW
收藏  |  浏览/下载:103/13  |  提交时间:2010/08/12


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