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浏览/检索结果: 共3条，第1-3条 帮助 限定条件 内容类型：会议论文     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Large ship fluid-structure coupling deformation calculation based on large deviation theory 会议论文 作者:  Liu, Xinyun;  Zhou, XinCong;  Zhang, Shesheng;  Li, Yuguang 收藏  |  浏览/下载：1/0  |  提交时间：2019/12/05 Ship  deformation  large deviation  the time series   Gray level correction algorithm of LED display panel based on least squares approximation (EI CONFERENCE) 会议论文 2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010, Changchun, China Sun Z.-Y.; Chang F.; Wang R.-G.; Zheng X.-F. 收藏  |  浏览/下载：16/0  |  提交时间：2013/03/25 Aiming at the problem that the linear characteristic of LED display panel is not compatible with the non-linear characteristic of image data  this leads to appear the large deviation during grayscale rendition  the gray level correction algorithm based on least squares approximation is provided. First  the necessity of gray level correction is analyzed. Then  the gray level correction algorithm model is constructed according to the principle of latest squares approximation. Next  realization steps are described in accordance with this constructed algorithm model. Finally  this algorithm is implemented in a LED display panel  whose resolution is 128128. Experimental results show that this algorithm is able to reduce the deviation obviously during grayscale rendition and the problem of gray level deformation can be resolved perfectly because the linear relation between image data after correcting and gray level is good which satisfies the linear characteristic of LED display panel. 2010 IEEE.   The effect of transparent film on its surface 3-D mapping by using vertical scanning white light interferometer (EI CONFERENCE) 会议论文 ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005, Changchun, China Wu X.; Lei F.; Yatagai T. 收藏  |  浏览/下载：11/0  |  提交时间：2013/03/25 We have investigated the effect of transparent thin film while mapping its surface profile by using vertical scanning white light interferometer. Our theory analysis showed that multiple reflections taking place within the transparent thin film result in an extra phase change. The simulation and experiment results revealed that this extra phase change is also related to the thickness of thin film  the numerical number of microscope interferometer objective and the spectral distribution of light source. As a result of extra phase change  the interferogram has some deviation in its shape or two interference fringes may appears while the thickness of thin film is large.