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A Single Gate Driver Based Solid-State Circuit Breaker Using Series Connected SiC MOSFETs 期刊论文
IEEE Transactions on Power Electronics, 2019, 卷号: 34, 页码: 2002-2006
作者:  Ren, Yu;  Yang, Xu;  Zhang, Fan;  Wang, Fei;  Tolbert, Leon M.
收藏  |  浏览/下载:35/0  |  提交时间:2019/11/19
A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application 期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2019, 卷号: Vol.66 No.2, 页码: 287-291
作者:  Fang, Xiangsheng;  Zhang, Jiliang;  Cui, Jie;  Huang, Zhengfeng;  Yang, Kang
收藏  |  浏览/下载:42/0  |  提交时间:2019/04/24
A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application 期刊论文
IEEE Transactions on Circuits and Systems II: Express Briefs, 2019, 卷号: Vol.66 No.2, 页码: 287-291
作者:  Aibin Yan;  Kang Yang;  Zhengfeng Huang;  Jiliang Zhang;  Jie Cui
收藏  |  浏览/下载:25/0  |  提交时间:2019/12/13
A New Differential Backup Protection Strategy for Smart Distribution Networks: A Fast and Reliable Approach 期刊论文
IEEE Access, 2019, 卷号: Vol.7, 页码: 38135-38145
作者:  Wenguo Li;  Yi Tan;  Yong Li;  Yijia Cao;  Chun Chen
收藏  |  浏览/下载:7/0  |  提交时间:2019/12/13
Fault-Tolerant Control Strategies for T-Type Three-Level Inverters Considering Neutral-Point Voltage Oscillations 期刊论文
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2019, 卷号: 66, 期号: 4, 页码: 2837-2846
作者:  Chen, Jie;  Zhang, Chenghui;  Chen, Alian;  Xing, Xiangyang
收藏  |  浏览/下载:6/0  |  提交时间:2019/12/11
A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application 期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2019, 卷号: Vol.66 No.2, 页码: 287-291
作者:  Yan, AB;  Yang, K;  Huang, ZF;  Zhang, JL;  Cui, J
收藏  |  浏览/下载:16/0  |  提交时间:2019/12/17
A Novel MTJ-Based Non-Volatile Ternary Content-Addressable Memory for High-Speed, Low-Power, and High-Reliable Search Operation 期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2019, 卷号: 66, 页码: 1454-1464
作者:  Wang, Chengzhi;  Zhang, Deming;  Zeng, Lang;  Deng, Erya;  Chen, Jie
收藏  |  浏览/下载:8/0  |  提交时间:2019/12/30
Integrated circuit failure analysis and reliability prediction based on physics of failure 期刊论文
ENGINEERING FAILURE ANALYSIS, 2019, 卷号: 104, 页码: 714-726
作者:  Jiao, Jian;  De, Xinlin;  Chen, Zhiwei;  Zhao, Tingdi
收藏  |  浏览/下载:6/0  |  提交时间:2019/12/30


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