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A scan disabling-based BAST scheme for test cost and test power reduction 期刊论文
IEICE ELECTRONICS EXPRESS, 2012, 卷号: Vol.9 No.2, 页码: 111-116
作者:  You, Zhiqiang;  Wang, Weizheng;  Liu, Peng;  Kuang, Jishun;  Qin, Zheng
收藏  |  浏览/下载:3/0  |  提交时间:2020/01/05
The Improved Apriori Algorithm Based on Compression Matrix Approach 期刊论文
Microelectronics & Computer, 2012, 卷号: Vol.29 No.6, 页码: 28-32,36
作者:  Fu Sha;  Liao Minghua;  Song Dan
收藏  |  浏览/下载:1/0  |  提交时间:2020/01/05


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