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长春光学精密机械与物... [1]
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会议论文 [1]
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2012 [1]
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发表日期:2012
专题:长春光学精密机械与物理研究所
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Comparison of radiation temperature measurement precision between middlewave and longwave thermal-imaging systems (EI CONFERENCE)
会议论文
2012 International Conference on Optoelectronics and Microelectronics, ICOM 2012, August 23, 2012 - August 25, 2012, Changchun, China
Sun Z.
;
Zhu W.
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提交时间:2013/03/25
A comparison study on temperature measurement precision between middlewave 3-5m and longwave 8-12m measuring thermal imaging systems has been conducted. The study was limited to systems working in indoor conditions and the target's temperature is in the range of 270K900K. First
the Disturb Resisting Function (DRF) of infrared systems is deduced. On the base of DRF curve
we find that the middlewave infrared system get the smaller influences under the same size disturb compared with the longwave system. A theory of the influence of target's physical characteristic and measurement conditions on the accuracy of temperature measurements has been developed. On the basis of the developed formulas an analysis of the influence of signal disturbances (because of incorrectly assumed emissivity
limited transmittance of the atmosphere
radiation reflected by the object and shift of optics radiation) on the accuracy of temperature measurement has been made. It has been found that the middlewave systems in typical temperature range offer generally better accuracy in temperature measurement than the longwave ones do. 2012 IEEE.
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