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Numerical scattering analysis of TE plane waves by a metallic diffraction grating with local defects 期刊论文
2010, 2010
Jiguang Sun; Chunxiong Zheng
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Talbot grating for color separation in color liquid crystal display 会议论文
Proceedings of the SPIE - The International Society for Optical Engineering, Holography and Diffractive Optics III, Beijing, China, INSPEC
Yan Zhang; Qiaofeng Tan; Yingbai Yan; Guofan Jin
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3-D profilometry system using the temporal phase unwrapping method 期刊论文
2010, 2010
Li Jianchang; Jin Guanchang; Ma Shaopeng
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Strain analysis on porous TiNi SMA using SEM moire method 期刊论文
2010, 2010
Hua Du; Huimin Xie; Haichang Jiang; Lijian Rong; Qiang Luo; Changzhi Gu; Yapu Zhao
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Far field analysis after chirped pulse passing through a misalignment tiled-grating compressor 期刊论文
2010, 2010
Zuo Yan-lei; Wei Xiao-feng; Zhu Qi-hua; Liu Hong-jie; Ying Chun-tong
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Manufacture for ruling concave metal grating with a long focal length (EI CONFERENCE) 会议论文
2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010, Changchun, China
Gao J.-X.
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The ruling technique for concave metal grating with long curvature radius (namely long focal length) is studied. In order to rule the concave grating with a long focal length  the diamond carriage with elastic thimble mode is designed and manufactured. It is available not only to rule plane grating  but to concave grating with a long focal length. The mathematic expression between the curvature radius of circular arc cutting edge of ruling tools for grating and the curvature radius of concave grating  the caliber of grating and the size of transverse direction of bit tool are given. The span of curvature radius of circular arc cutting edge is analyzed theoretically. The concave metal grating with 30m curvature radius for 10.6m laser system is manufactured. The testing result shows that the quality of groove is perfect and the diffraction efficiency is more than 95.6 percent. 2010 IEEE.  
High-performance soft x-ray spectromicroscopy beamline at SSRF (EI CONFERENCE) 会议论文
Xue C.; Wang Y.; Guo Z.; Wu Y.; Zhen X.; Chen M.; Chen J.; Xue S.; Peng Z.; Lu Q.; Tai R.
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