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A novel electrical measurement method of peak junction temperature based on the excessive thermotaxis effect of low current 期刊论文
Journal of Semiconductors, 2009, 卷号: 30, 期号: 9, 页码: 41-44
作者:  Zhu Yangjun;  Miao Qinghai;  Zhang Xinghua;  Han Zhengsheng
收藏  |  浏览/下载:3/0  |  提交时间:2019/12/26
不同温度下半导体硅势垒的正向I-V特性曲线的汇聚特性 期刊论文
半导体学报, 2008, 卷号: 29, 期号: 4, 页码: 663-667
作者:  Miao,Qinghai;  Lu,Shujin;  Zhang,Xinghua;  Zong,Fujian;  Zhu,Yangjun
收藏  |  浏览/下载:1/0  |  提交时间:2019/12/26
A novel thermal spectrum analysis method for reliability analysis of semiconductor devices 会议论文
20th Annual Canadian Conference on Electrical and Computer Engineering, APR 22-26, 2007
作者:  Zhu, Yangjun;  Miao, Chunyan;  Miao, Qinghai;  Zhang, Xinghua;  Lu, Shuojin
收藏  |  浏览/下载:1/0  |  提交时间:2019/12/31
Measurement of junction temperature inhomogeneity of bipolar transistors by ΔVbe method 期刊论文
Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 2000, 卷号: 21, 期号: 10, 页码: 1028-1031
作者:  Yang Zhiwei;  Miao Qinghai;  Zhang Dejun;  Zhang Xinghua;  Yang Lieyong
收藏  |  浏览/下载:1/0  |  提交时间:2020/01/14
Effects of transistor casing on output performance of transistor circuits 会议论文
7th International Symposium on IC Technology, Systems and Applications ISIC 97, 10 September 1997 through 12 September 1997
作者:  Miao, Qinghai;  Zhang, D.H.;  Wang, Jiajian;  Shi, Wei;  Xia, Chuanyue
收藏  |  浏览/下载:1/0  |  提交时间:2019/12/31


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