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CORC

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Assessment of sugarcane bagasse gasification in supercritical water for hydrogen production 会议论文
作者:  Cao, Wen;  Guo, Liejin;  Yan, Xuecheng;  Zhang, Deming;  Yao, Xiangdong
收藏  |  浏览/下载：4/0  |  提交时间：2019/11/26
Novel Cascadable Magnetic Majority Gates for Implementing Comprehensive Logic Functions 期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2018, 卷号: 65, 页码: 4687-4693
作者:  Li, Xin;  Song, Min;  Xu, Nuo;  Luo, Shijiang;  Zou, Qiming
收藏  |  浏览/下载：12/0  |  提交时间：2019/11/26
Primary investigation the impacts of the external memory (DDR3) failures on the performance of Xilinx Zynq-7010 SoC based system (MicroZed) using laser irradiation 会议论文
作者:  Liu, Shuhuan;  Du, Xuecheng;  Du, Xiaozhi;  Zhang, Yao;  Mubashiru, Lawal Olarewaju
收藏  |  浏览/下载：11/0  |  提交时间：2019/11/26
Numerical and experimental research of internal temperature field of oil-immersed core shunt reactor with ultra-high voltage 期刊论文
Gaoya Dianqi/High Voltage Apparatus, 2017, 卷号: 53, 页码: 163-168
作者:  Liu, Fenxia;  Liu, Ye;  Yu, Yunchang;  Wu, Jiang;  Li, Jilong
收藏  |  浏览/下载：5/0  |  提交时间：2019/11/26
Measurement of single event effects induced by alpha particles in the Xilinx Zynq-7010 System-on-Chip 期刊论文
JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 2017, 卷号: 54, 页码: 287-292
作者:  Du, Xuecheng;  He, Chaohui;  Liu, Shuhuan;  Zhang, Yao;  Li, Yonghong
收藏  |  浏览/下载：10/0  |  提交时间：2019/11/26
Single event effects sensitivity of low energy proton in Xilinx Zynq-7010 system-on chip 期刊论文
MICROELECTRONICS RELIABILITY, 2017, 卷号: 71, 页码: 65-70
作者:  Du, Xuecheng;  Liu, Shuhuan;  Luo, Dongyang;  Zhang, Yao;  Du, Xiaozhi
收藏  |  浏览/下载：6/0  |  提交时间：2019/11/26
Soft error evaluation and vulnerability analysis in Xilinx Zynq-7010 system-on chip 会议论文
作者:  Du, Xuecheng;  He, Chaohui;  Liu, Shuhuan;  Zhang, Yao;  Li, Yonghong
收藏  |  浏览/下载：10/0  |  提交时间：2019/12/02
Primary single event effect studies on Xilinx 28-nm System-on-Chip (SoC) 会议论文
作者:  Zhang, Yao;  Liu, Shuhuan;  Du, Xuecheng;  Yuan, Yuan;  He, Chaohui
收藏  |  浏览/下载：4/0  |  提交时间：2019/12/02
Hot carrier effect on the bipolar transistors' response to electromagnetic interference 期刊论文
MICROELECTRONICS RELIABILITY, 2015, 卷号: 55, 期号: [db:dc_citation_issue], 页码: 514-519
作者:  Xiong Cen;  Liu Shuhuan;  Li Yonghong;  Tang Du;  Zhang Jinxin
收藏  |  浏览/下载：7/0  |  提交时间：2019/12/02
Primary total ionizing dose effect studies on Xilinx SoC irradiated with Co-60 gamma rays 会议论文
作者:  Zhang, Yao;  Du, Xin;  Du, Xuecheng;  He, Dongsheng;  Zhang, Lingang
收藏  |  浏览/下载：11/0  |  提交时间：2019/12/02

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