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Preliminary single event effect distribution investigation on 28?nm SoC using heavy ion microbeam 期刊论文
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 2018
作者:  Yang, Weitao;  Du, Xuecheng;  Guo, Jinlong;  Wei, Junze;  Du, Guanghua
收藏  |  浏览/下载:26/0  |  提交时间:2019/11/19
Single-event multiple transients in guard-ring hardened inverter chains of different layout designs 期刊论文
MICROELECTRONICS RELIABILITY, 2018, 卷号: 87, 页码: 151-157
作者:  Zhao, Wen;  He, Chaohui;  Chen, Wei;  Chen, Rongmei;  Cong, Peitian
收藏  |  浏览/下载:3/0  |  提交时间:2019/11/26
Enhanced performance for Eu(iii) ion remediation using magnetic multiwalled carbon nanotubes functionalized with carboxymethyl cellulose nanoparticles synthesized by plasma technology 期刊论文
INORGANIC CHEMISTRY FRONTIERS, 2018, 卷号: 5, 页码: 3184-3196
作者:  Zong, Pengfei;  Cao, Duanlin;  Cheng, Yuan;  Wang, Shoufang;  Hayat, Tasawar
收藏  |  浏览/下载:6/0  |  提交时间:2019/11/26
Microbeam Heavy-Ion Single-Event Effect on Xilinx 28-nm System on Chip 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 页码: 545-549
作者:  Yang, Weitao;  Du, Xuecheng;  He, Chaohui;  Shi, Shuting;  Cai, Li
收藏  |  浏览/下载:11/0  |  提交时间:2019/11/26
SINGLE EVENT EFFECT CHARACTERISTICS ANALYSIS OF TYPICAL CIRCUIT ELEMENTS IN SPACECRAFT POWER SYSTEMS 会议论文
作者:  Zhao Wen;  He Chaohui;  Chen Wei;  Guo Xiaoqiang;  Cong Peitian
收藏  |  浏览/下载:10/0  |  提交时间:2019/11/26
An Investigation of ELDRS in Different SiGe Processes 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2017, 卷号: 64, 页码: 1137-1141
作者:  Li, Pei;  He, Chaohui;  Guo, Hongxia;  Guo, Qi;  Zhang, Jinxin
收藏  |  浏览/下载:3/0  |  提交时间:2019/11/26
Heavy ion micro-beam study of single-event transient (SET) in SiGe heterjunction bipolar transistor 期刊论文
SCIENCE CHINA-INFORMATION SCIENCES, 2017, 卷号: 60
作者:  Zhang, Jinxin;  Guo, Hongxia;  Zhang, Fengqi;  He, Chaohui;  Li, Pei
收藏  |  浏览/下载:3/0  |  提交时间:2019/11/26
Time dependent modeling of single particle displacement damage in silicon devices 期刊论文
MICROELECTRONICS RELIABILITY, 2016, 卷号: 60, 期号: [db:dc_citation_issue], 页码: 25-32
作者:  Tang, Du;  Martin-Bragado, Ignacio;  He, Chaohui;  Zang, Hang;  Xiong, Cen
收藏  |  浏览/下载:2/0  |  提交时间:2019/12/02
Re-evaluation of neutron displacement cross sections for silicon carbide by a Monte Carlo approach 期刊论文
JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 2016, 卷号: 53, 期号: [db:dc_citation_issue], 页码: 161-172
作者:  Guo, Daxi;  He, Chaohui;  Zang, Hang;  Zhang, Peng;  Ma, Li
收藏  |  浏览/下载:2/0  |  提交时间:2019/12/02
Impact of Bias Conditions on Total Ionizing Dose Effects of Co-60 gamma in SiGe HBT 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2016, 卷号: 63, 期号: [db:dc_citation_issue], 页码: 1251-1258
作者:  Zhang, Jinxin;  Guo, Qi;  Guo, Hongxia;  Lu, Wu;  He, Chaohui
收藏  |  浏览/下载:1/0  |  提交时间:2019/12/02


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