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浏览/检索结果: 共5条，第1-5条 帮助 限定条件 专题：北京大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Total ionizing dose (TID) effect and single event effect (SEE) in quasi-SOI nMOSFETs 期刊论文 semiconductor science and technology, 2014 Tan, Fei; Huang, Ru; An, Xia; Wu, Weikang; Feng, Hui; Huang, Liangxi; Fan, Jiewen; Zhang, Xing; Wang, Yangyuan 收藏  |  浏览/下载：5/0  |  提交时间：2015/11/13 quasi-SOI device  single event effect (SEE)  total ionizing dose (TID)  worst case  TECHNOLOGIES  TRANSISTOR  CANDIDATE  MOSFET  UPSET   Two-Dimensional Self-Limiting Wet Oxidation of Silicon Nanowires: Experiments and Modeling 期刊论文 ieee电子器件汇刊, 2013 Fan, Jiewen; Huang, Ru; Wang, Runsheng; Xu, Qiumin; Ai, Yujie; Xu, Xiaoyan; Li, Ming; Wang, Yangyuan 收藏  |  浏览/下载：5/0  |  提交时间：2015/11/10 CMOS process  nanowire  self-limiting oxidation (SLO)  shape engineering  size controlling  stress effect  THERMAL-OXIDATION  SI NANOWIRES  ORIENTATION  TRANSISTORS   Investigations on Line-Edge Roughness (LER) and Line-Width Roughness (LWR) in Nanoscale CMOS Technology: Part II-Experimental Results and Impacts on Device Variability 期刊论文 ieee电子器件汇刊, 2013 Wang, Runsheng; Jiang, Xiaobo; Yu, Tao; Fan, Jiewen; Chen, Jiang; Pan, David Z.; Huang, Ru 收藏  |  浏览/下载：7/0  |  提交时间：2015/11/10 FinFET  line-edge roughness (LER)  line-width roughness (LWR)  nanowire  variability  INTRINSIC PARAMETER FLUCTUATIONS  FINFET MATCHING PERFORMANCE  MOSFETS  DECANANOMETER  NANOWIRES  OXIDATION  NOISE   Two-dimensional Self-limiting Oxidation for Non-planar Silicon Nano-devices from Top-down Approach: Experiments and Modeling 其他 2012-01-01 Fan, Jiewen; Xu, Qiumin; Jiang, Zizhen; Ai, Yujie; Wang, Runsheng; Huang, Ru 收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13 THERMAL-OXIDATION  NANOWIRES  SI   New Understanding of the Statistics of Random Telegraph Noise in Si Nanowire Transistors - the Role of Quantum Confinement and Non-stationary Effects 其他 2011-01-01 Liu, Changze; Wang, Runsheng; Zou, Jibin; Huang, Ru; Fan, Chunhui; Zhang, Lijie; Fan, Jiewen; Ai, Yujie; Wang, Yangyuan 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13 SEMICONDUCTORS