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CORC

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Simulation of Positive Bias Temperature Instability (PBTI) in high-k FinFET by KMC method 其他
2015-01-01
Li, Yun; Wang, Yijiao; Jiang, Hai; Du, Gang; Kang, Jinfeng; Liu, Xiaoyan
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
Time dependent 3-D statistical KMC simulation of high-k degradation including trap generation and electron capture/emission dynamic 其他
2014-01-01
Wang, Yijiao; Huang, Peng; Liu, Xiaoyan; Du, Gang; Kang, Jinfeng
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
Impact of random discrete dopant in extension induced fluctuation in gate-source/drain underlap FinFET 其他
2014-01-01
Wang, Yijiao; Huang, Peng; Xin, Zheng; Zeng, Lang; Liu, Xiaoyan; Du, Gang; Kang, Jinfeng
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
Strain affected electronic properties of bilayer tungsten disulfide 其他
2014-01-01
Xin, Zheng; Zeng, Lang; Wang, Yijiao; Wei, Kangliang; Du, Gang; Kang, Jinfeng; Liu, Xiaoyan
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
Simulation of the RRAM based Nonvolatile SRAM cell 其他
2014-01-01
Zheng, Yang; Huang, Peng; Li, Haitong; Liu, Xiaoyan; Kang, Jinfeng; Du, Gang
收藏  |  浏览/下载：5/0  |  提交时间：2015/11/13
Electronic structures of strained MoS2 nanoribbons 其他
2014-01-01
Ruan, Si; Xin, Zheng; Zeng, Lang; Kang, Jinfeng; Du, Gang; Liu, Xiaoyan
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13
Improved memory characteristics of a novel TaN/Al2O 3/TiO2/HfO2/SiO2/Si structured charge trapping memory 其他
2013-01-01
Peng, Yahua; Liu, Fei; Liu, Xiaoyan; Du, Gang; Kang, Jinfeng
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
Impact of Junction nonabruptness on random-discrete-dopant induced variability in intrinsic channel trigate metal-oxide-semiconductor field-effect transistors 其他
2013-01-01
Wei, Kang Liang; Liu, Xiao Yan; Du, Gang
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
Optimization of conductive filament of oxide-based resistive-switching random access memory for low operation current by stochastic simulation 其他
2013-01-01
Huang, Peng; Deng, Yexin; Gao, Bin; Chen, Bing; Zhang, Feifei; Yu, Di; Liu, Lingfeng; Du, Gang; Kang, Jinfeng; Liu, Xiaoyan
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
Random Interface Trap Induced Fluctuation in 22nm High-k/Metal Gate Junctionless and Inversion-mode FinFETs 其他
2013-01-01
Wang, Yijiao; Wei, Kangliang; Liu, Xiaoyan; Du, Gang; Kang, Jinfeng
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13

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