QQ客服 官方微博 反馈留言

浏览/检索结果: 共10条，第1-10条 帮助 限定条件 内容类型：其他     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Research progress on core-shell nanowire FETs 其他 2014-01-01 He, Jin; Zhang, Lining; Zhang, Xiangyu; Wu, Wen; Wang, Wenping; Ma, Miaomiao; Ye, Yun; Chan, Mansun 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/17 A physical based model to predict performance degradation of FinFET accounting for interface state distribution effect due to hot carrier injection 其他 2011-01-01 Ma, Chenyue; Zhang, Lining; Zhang, Chenfei; Zhang, Xiufang; He, Jin; Zhang, Xing 收藏  |  浏览/下载：7/0  |  提交时间：2017/12/03 FinFET: From compact modeling to circuit performance 其他 2010-01-01 He, Frank; Zhou, Xingye; Ma, Chenyue; Zhang, Jian; Liu, Zhiwei; Wu, Wen; Zhang, Xukai; Zhang, Lining 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13 A complete analytic surface potential-based core model for intrinsic nanowire surrounding-gate MOSFETs 其他 2009-01-01 He, Jin; Zhang, Lining; Zhang, Jian; Ma, Chenyue; Liu, Feilong; Chan, Mansun 收藏  |  浏览/下载：4/0  |  提交时间：2015/11/10 non-classical MOS transistor  surrounding-gate MOSFETs  device physics  surface potential model  non-charge-sheet approximation  MOS-TRANSISTOR  CHARGE  PERFORMANCE   A Unified FinFET Reliability Model Including High K Gate Stack Dynamic Threshold Voltage, Hot Carrier Injection, and Negative Bias Temperature Instability 其他 2009-01-01 Ma, Chenyue; Li, Bo; Zhang, Lining; He, Jin; Zhang, Xing; Lin, Xinnan; Chan, Mansun 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/12 Model  Reliability  HKSDT  HCI  NBTI  circuit  NBTI DEGRADATION  GENERATION  ELECTRONS   A physical based Hot Carrier Injection compact model for nanoscale FinFET 其他 2009-01-01 Ma, Chenyue; Li, Bo; Zhang, Lining; He, Jin; Zhang, Xing; Lin, Xinnan 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 FinFET reliability study by forward gated-diode method 其他 2008-01-01 Chenyue, Ma.; Li, Bo; Wei, Yiqun; Zhang, Lining; He, Jin; Zhang, Xing; Lin, Xinnan 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/12 FinFET Reliability Study by Forward Gated-Diode Method 其他 2008-01-01 Ma, Chenyue; Li, Bo; Wei, Yiqun; Zhang, Lining; He, Jin; Zhang, Xing; Lin, Xinnan 收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13 FinFET  G-R current  stress  interface state  distribution  reliability issue  SOI  INTERFACE  MOSFETS  TRAPS   A complete analytic surface potential-based core model for undoped cylindrical surrounding-gate MOSFETs 其他 2008-01-01 Jin, He; Jian, Zhang; Lining, Zhang; Chenyue, Ma; Mansun, Chan 收藏  |  浏览/下载：5/0  |  提交时间：2015/11/13 Diode parameter extraction by a linear cofactor difference operation method 其他 2008-01-01 Chenyue, Ma; Li, Bo; Chen, Yu; Zhang, Lining; He, Jin; Zhang, Xing 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13