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浏览/检索结果: 共5条，第1-5条 帮助 限定条件 内容类型：其他     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 DTMOS mode as an effective solution of RTN suppression for robust device/circuit co-design 其他 2015-01-01 Guo, Shaofeng; Huang, Ru; Hao, Peng; Luo, Mulong; Ren, Pengpeng; Wang, Jianping; Bu, Weihai; Wu, Jingang; Wong, Waisum; Yu, Scott; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Runsheng; Wang, Yangyuan 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 New Observations on Complex RTN in Scaled High-kappa/Metal-gate MOSFETs - the Role of Defect Coupling under DC/AC Condition 其他 2013-01-01 Ren, Pengpeng; Hao, Peng; Liu, Changze; Wang, Runsheng; Jiang, Xiaobo; Qin, Yingxin; Huang, Ru; Guo, Shaofeng; Luo, Mulong; Zou, Jibin; Li, Meng; Wang, Jianping; Wu, Jingang; Liu, Jinhua; Bu, Weihai; Wong, Waisum; Yu, Scott; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13 Deep understanding of AC RTN in MuGFETs through new characterization method and impacts on logic circuits 其他 2013-01-01 Zou, Jibin; Wang, Runsheng; Luo, Mulong; Huang, Ru; Xu, Nuo; Ren, Pengpeng; Liu, Changze; Xiong, Weize; Wang, Jianping; Liu, Jinhua; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan 收藏  |  浏览/下载：5/0  |  提交时间：2015/11/13 New observations on complex RTN in scaled high-��/metal-gate MOSFETs - The role of defect coupling under DC/AC condition 其他 2013-01-01 Ren, Pengpeng; Hao, Peng; Liu, Changze; Wang, Runsheng; Jiang, Xiaobo; Qiu, Yingxin; Huang, Ru; Guo, Shaofeng; Luo, Mulong; Zou, Jibin; Li, Meng; Wang, Jianping; Wu, Jingang; Liu, Jinhua; Bu, Weihai; Wong, Waisum; Yu, Scott; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13 An Automatic Compliance Checking Approach for Software Processes 其他 2009-01-01 He, Xiaoyang; Guo, Jingang; Wang, Yasha; Guo, Ying 收藏  |  浏览/下载：1/0  |  提交时间：2015/11/12 software process  process pattern  quality assurance  compliance  compliance checking