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浏览/检索结果: 共13条，第1-10条 帮助 限定条件 内容类型：其他    专题：北京大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Reliability investigation of high-k/metal gate in nMOSFETs by three-dimensional kinetic Monte-Carlo simulation with multiple trap interactions 其他 2016-01-01 Li, Yun; Jiang, Hai; Lun, Zhiyuan; Wang, Yijiao; Huang, Peng; Hao, Hao; Du, Gang; Zhang, Xing; Liu, Xiaoyan 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 OXIDE  MODEL  BIAS  DEGRADATION  TECHNOLOGY  DEFECTS  STACKS  NOISE  PBTI  HFO2   Evaulation the Degradation in nMOSFETs with HfO2 Gate Dielectric and Interfacial Layer by 3D Kinetic Monte-Carlo Method 其他 2016-01-01 Li, Yun; Lun, Zhiyuan; Wang, Yijiao; Huang, Peng; Jiang, Hai; Zhang, Xing; Du, Gang; Liu, Xiaoyan 收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03 Investigation the Impact of Composition on the Performance of SiGe Nanowire pMOSFETs by Different Simulation Methods 其他 2016-01-01 Xianle Zhang; Xiaoyan Liu; Yijiao Wang; Longxiang Yin; Gang Du 收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03 drift  Poisson  solver  SiGe  default  deviation  beyond  drain  calibration  executed  drift  Poisson  solver  SiGe  default  deviation  beyond  drain  calibration  executed   Simulation of Positive Bias Temperature Instability (PBTI) in high-k FinFET by KMC method 其他 2015-01-01 Li, Yun; Wang, Yijiao; Jiang, Hai; Du, Gang; Kang, Jinfeng; Liu, Xiaoyan 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 3D KMC reliability simulation of nano-scaled HKMG nMOSFETs with multiple traps coupling 其他 2015-01-01 Li, Yun; Lun, Zhiyuan; Huang, Peng; Wang, Yijiao; Jiang, Hai; Du, Gang; Liu, Xiaoyan 收藏  |  浏览/下载：8/0  |  提交时间：2017/12/03 3D KMC Reliability Simulation of Nano-Scaled HKMG nMOSFETs with Multiple Traps Coupling 其他 2015-01-01 Li, Yun; Lun, Zhiyuan; Huang, Peng; Wang, Yijiao; Jiang, Hai; Du, Gang; Liu, Xiaoyan 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 HKMG  nMOSFETs  3D  kinetic Monte-Carlo  multiple traps  coupling  trap generation/recombination  capture time  emission time  threshold voltage shift  trapping  detrapping  PBTI   Time dependent 3-D statistical KMC simulation of high-k degradation including trap generation and electron capture/emission dynamic 其他 2014-01-01 Wang, Yijiao; Huang, Peng; Liu, Xiaoyan; Du, Gang; Kang, Jinfeng 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 Impact of random discrete dopant in extension induced fluctuation in gate-source/drain underlap FinFET 其他 2014-01-01 Wang, Yijiao; Huang, Peng; Xin, Zheng; Zeng, Lang; Liu, Xiaoyan; Du, Gang; Kang, Jinfeng 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 Strain affected electronic properties of bilayer tungsten disulfide 其他 2014-01-01 Xin, Zheng; Zeng, Lang; Wang, Yijiao; Wei, Kangliang; Du, Gang; Kang, Jinfeng; Liu, Xiaoyan 收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03 Random Interface Trap Induced Fluctuation in 22nm High-k/Metal Gate Junctionless and Inversion-mode FinFETs 其他 2013-01-01 Wang, Yijiao; Wei, Kangliang; Liu, Xiaoyan; Du, Gang; Kang, Jinfeng 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13