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Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer 期刊论文
半导体学报, 2007, 卷号: 28, 期号: 7, 页码: 1012-1016
作者:  Zhao Lei;  Chen Shaowu;  Zuo Yuhua;  Chen Ping
收藏  |  浏览/下载:124/19  |  提交时间:2010/11/23
Comparison between double crystals X-ray diffraction micro-Raman measurement on composition determination of high Ge content Si1_xGex layer epitaxied on Si substrate 期刊论文
journal of materials science & technology, 2006, 卷号: 22, 期号: 5, 页码: 651-654
Zhao L (Zhao Lei); Zuo YH (Zuo Yuhua); Cheng BW (Cheng Buwen); Yu JZ (Yu Jinzhong); Wang QM (Wang Qiming)
收藏  |  浏览/下载:38/0  |  提交时间:2010/04/11
Growth of near planar Si0.5Ge0.5 epitaxial layers directly on Si substrate by UHV/CVD at 500℃ 期刊论文
功能材料与器件学报, 2006, 卷号: 12, 期号: 1, 页码: 5-9
作者:  ZHAO Lei
收藏  |  浏览/下载:16/0  |  提交时间:2010/11/23
Fabrication of SiGe/Si Multi-Quantum Wells Resonant-Cavity-Enhanced Detector 期刊论文
半导体学报, 2004, 卷号: 25, 期号: 12, 页码: 1576-1579
作者:  Cheng Buwen;  Zhao Lei;  Zuo Yuhua
收藏  |  浏览/下载:12/0  |  提交时间:2010/11/23


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