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浏览/检索结果: 共7条，第1-7条 帮助 限定条件 发表日期：2016    内容类型：其他     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Boundary Harnack Principle and Gradient Estimates for Fractional Laplacian Perturbed by Non-local Operators 其他 2016-01-01 Chen, Zhen-Qing; Ren, Yan-Xia; Yang, Ting 收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03 Harmonic function  Boundary Harnack principle  Gradient estimate  Non-local operator  Green function  Poisson kernel  LEVY PROCESSES  OPEN SETS   ESD-reliability characterizations of a 45-V p-channel LDMOS-SCR with the discrete-cathode end 其他 2016-01-01 Chen, Shen-Li; Huang, Yu-Ting; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 Analysis of Kirk effect of an innovated high side Side-Isolated N-LDMOS device 其他 2016-01-01 Lai, Ciou Jhong; Sheu, Gene; Chien, Ting Yao; Wu, Chieh Chih; Lee, Tzu Chieh; Deivasigamani, Ravi; Wu, Ching Yuan; Chandrashekhar; Yang, Shao Ming 收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03 ESD-Reliability Characterizations of a 45-V p-Channel LDMOS-SCR with the Discrete-Cathode End 其他 2016-01-01 Chen, Shen-Li; Huang, Yu-Ting; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 P-type laterally-diffused metal oxide semiconductor (pLDMOS)  Electrostatic Discharge (ESD)  Holding voltage (V-h)  Secondary breakdown current (I-t2)   FSD Protection Design for the 45-V pLDMOS-SCR (p-n-p-Arranged) Devices with Source-Discrete Distributions 其他 2016-01-01 Chen, Shen-Li; Huang, Yu-Ting; Yen, Chih-Ying; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung 收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03 Electrostatic-discharge (ESD)  Holding voltage (V-h)  p-channel lateral-diffused MOSFET (pLDMOS)  Secondary breakdown-current (I-1/2)  Silicon controlled rectifier (SCR)  Trigger Voltage (V-t1)   Study of impact of LATID on HCI reliability for LDMOS devices 其他 2016-01-01 Chandrashekhar; Sheu, Gene; Yang, Shao Ming; Chien, Ting Yao; Lin, Yun Jung; Wu, Chieh Chih; Lee, Tzu Chieh 收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03 HOT-CARRIER RELIABILITY  DEGRADATION  TRANSISTORS  MOSFET   Expert consensus on perioperative medications during endoscopic submucosal dissection for gastric lesions (2015, Suzhou, China) 其他 2016-01-01 作者:  Bai, Yu;  Cai, Jian Ting;  Chen, You Xiang;  Gao, Fei;  Guo, Xiao Zhong 收藏  |  浏览/下载：16/0  |  提交时间：2019/12/05