CORC

浏览/检索结果: 共7条,第1-7条 帮助

限定条件                        
已选(0)清除 条数/页:   排序方式:
Current status and historical variations of phthalate ester (PAE) contamination in the sediments from a large Chinese lake (Lake Chaohu) 其他
2016-01-01
Kang, Lei; Wang, Qing-Mei; He, Qi-Shuang; He, Wei; Liu, Wen-Xiu; Kong, Xiang-Zhen; Yang, Bin; Yang, Chen; Jiang, Yu-Jiao; Xu, Fu-Liu
收藏  |  浏览/下载:11/0  |  提交时间:2017/12/03
Exponential rate of periodic points and metric entropy in nonuniformly hyperbolic systems 其他
2016-01-01
Liao, Gang; Sun, Wenxiang; Yang, Yun
收藏  |  浏览/下载:4/0  |  提交时间:2017/12/03
A Low-Noise Closed-Loop Interface for High-G Capacitive Micro-Accelerometer 其他
2016-01-01
Zhao, Meng; Chen, Zhongjian; Yang, Yixin; Niu, Yuze; Chen, Guangyi; Lu, Wengao; Zhang, Yacong
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03
ESD Reliability Improvement of the 0.25-mu m 60-V Power nLDMOS with Discrete Embedded SCRs Separated by STI Structures 其他
2016-01-01
Chen, Shen-Li; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Chen, Hung-Wei
收藏  |  浏览/下载:4/0  |  提交时间:2017/12/03
Design on ESD Robustness of Source-side Discrete Distribution in the 60-V High-Voltage nLDMOS Devices 其他
2016-01-01
Chen, Shen-Li; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming
收藏  |  浏览/下载:3/0  |  提交时间:2017/12/03
LDMOS  
ESD-Reliability Characterizations of a 45-V p-Channel LDMOS-SCR with the Discrete-Cathode End 其他
2016-01-01
Chen, Shen-Li; Huang, Yu-Ting; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun
收藏  |  浏览/下载:3/0  |  提交时间:2017/12/03
Gate Engineering in SOI LDMOS for Device Reliability 其他
2016-01-01
Aanand; Sheu, Gene; Imam, Syed Sarwar; Lu, Shao Wei; Aryadeep, Chirag; Yang, Shao Ming
收藏  |  浏览/下载:8/0  |  提交时间:2017/12/03


©版权所有 ©2017 CSpace - Powered by CSpace