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CORC

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Raman scattering detection of stacking faults in free-standing cubic-SiC epilayer 期刊论文
chinese physics letters, 2006, 卷号: 23, 期号: 10, 页码: 2834-2837
Liu XF (Liu Xing-Fang); Sun GS (Sun Guo-Sheng); Li JM (Li Jin-Min); Zhao YM (Zhao Yong-Mei); Li JY (Li Jia-Ye); Wang L (Wang Lei); Zhao WS (Zhao Wan-Shun); Zeng YP (Zeng Yi-Ping)
收藏  |  浏览/下载：75/0  |  提交时间：2010/04/11
Annealing and activation of silicon implanted in semi-insulating InP substrates 期刊论文
materials science in semiconductor processing, 2003, 卷号: 6, 期号: 4, 页码: 215-218
Dong HW; Zhao YW; Li JM
收藏  |  浏览/下载：48/0  |  提交时间：2010/08/12
Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers 会议论文
9th international conference on defects: recognition, imaging and physics in semiconductors (drip ix), rimini, italy, sep 24-28, 2001
Zhao YW; Sun NF; Dong HW; Jiao JH; Zhao JQ; Sun TN; Lin LY
收藏  |  浏览/下载：14/0  |  提交时间：2010/11/15
The transition from Eu3+ to Eu2+ in SiO2(Eu) thin films prepared by ion implantation and co-sputtering 期刊论文
acta physica sinica, 2001, 卷号: 50, 期号: 3, 页码: 532-535
Liu FZ; Zhu MF; Liu T; Li BC
收藏  |  浏览/下载：165/50  |  提交时间：2010/08/12
Ion bombardment as the initial stage of diamond film growth 期刊论文
journal of applied physics, 2001, 卷号: 89, 期号: 3, 页码: 1983-1985
Liao MY; Qin FG; Zhang JH; Liu ZK; Yang SY; Wang ZG; Lee ST
收藏  |  浏览/下载：43/0  |  提交时间：2010/08/12
The microstructure and its high-temperature annealing behaviours of a-Si : O : H film 期刊论文
acta physica sinica, 2001, 卷号: 50, 期号: 12, 页码: 2418-2422
Wang YQ; Chen CY; Chen WD; Yang FH; Diao HW
收藏  |  浏览/下载：82/6  |  提交时间：2010/08/12
Intraband absorption in the 8-12 mu m band from Si-doped vertically aligned InGaAs/GaAs quantum-dot superlattice 期刊论文
applied physics letters, 1998, 卷号: 73, 期号: 25, 页码: 3706-3708
Zhuang QD; Li JM; Li HX; Zeng YP; Pan L; Chen YH; Kong MY; Lin LY
收藏  |  浏览/下载：25/0  |  提交时间：2010/08/12
A study of the interface of CeO2/Si heterostructure grown by ion beam deposition 期刊论文
vacuum, 1998, 卷号: 51, 期号: 3, 页码: 397-401
Wu ZL; Huang DD; Yang XZ
收藏  |  浏览/下载：37/0  |  提交时间：2010/08/12
TRANSMISSION ELECTRON-MICROSCOPY STUDY OF N+-IMPLANTED SILICON ON INSULATOR BY ENERGY-FILTERED IMAGING 期刊论文
journal of applied physics, 1991, 卷号: 70, 期号: 3, 页码: 1850-1852
DUAN XF; DU AY; CHU YM
收藏  |  浏览/下载：12/0  |  提交时间：2010/11/15

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