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Extended selective encoding of scan slices for reducing test data and test power 期刊论文
Ieice transactions on information and systems, 2010, 卷号: E93d, 期号: 8, 页码: 2223-2232
作者:  Liu, Jun;  Han, Yinhe;  Li, Xiaowei
收藏  |  浏览/下载:43/0  |  提交时间:2019/05/10
Design-for-testability features and test implementation of a giga hertz general purpose microprocessor 期刊论文
Journal of computer science and technology, 2008, 卷号: 23, 期号: 6, 页码: 1037-1046
作者:  Wang, Da;  Hu, Yu;  Li, Hua-Wei;  Li, Xiao-Wei
收藏  |  浏览/下载:17/0  |  提交时间:2019/05/10


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