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Insights Into the Power-Off and Power-On Transient Performance of Power-Rail ESD Clamp Circuits 期刊论文
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2017
Lu, Guangyi; Wang, Yuan; Wang, Yize; Zhang, Xing
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
Simulation and evaluation of thermal mechanical reliability of 3D-TSV stack with viscoelastic underfill 其他
2016-01-01
Zeng, Qinghua; Guan, Yong; Su, Fei; Chen, Jing; Jin, Yufeng
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
Multiple Sensor Data Fusion for Degradation Modeling and Prognostics Under Multiple Operational Conditions 期刊论文
IEEE TRANSACTIONS ON RELIABILITY, 2016
Yan, Hao; Liu, Kaibo; Zhang, Xi; Shi, Jianjun
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/04
Adaptive Relay-Aided OFDM Underwater Acoustic Communications 其他
2015-01-01
Cheng, Xilin; Yang, Liuqing; Cheng, Xiang
收藏  |  浏览/下载：9/0  |  提交时间：2017/12/03
Simulation and Evaluation of Thermal Mechanical Reliability of 3D-TSV Stack with Viscoelastic Underfill 其他
2015-01-01
Zeng, Qinghua; Guan, Yong; Su, Fei; Chen, Jing; Jin, Yufeng
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
Gapped smoothing algorithm applied to defect identification using pulsed thermography 期刊论文
NONDESTRUCTIVE TESTING AND EVALUATION, 2015
Li, Bing; Ye, Lin; Li, Eric; Shou, Dahua; Li, Zheng; Chang, Li
收藏  |  浏览/下载：8/0  |  提交时间：2017/12/03
Impacts of Cycle-to-Cycle Variation effects on the Prediction of NBTI Degradation and the Resulted Dynamic Variations in High-kappa MOSFETs 其他
2013-01-01
Ren, Pengpeng; Liu, Changze; Wang, Runsheng; Li, Meng; Wang, Yangyuan; Huang, Ru
收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13
Impacts of cycle-to-cycle variation effects on the prediction of NBTI degradation and the resulted dynamic variations in high-�� MOSFETs 其他
2013-01-01
Ren, Pengpeng; Liu, Changze; Wang, Runsheng; Li, Meng; Wang, Yangyuan; Huang, Ru
收藏  |  浏览/下载：5/0  |  提交时间：2015/11/13
The Complexity of Standing Postural Control in Older Adults: A Modified Detrended Fluctuation Analysis Based upon the Empirical Mode Decomposition Algorithm 期刊论文
plos one, 2013
Zhou, Junhong; Manor, Brad; Liu, Dongdong; Hu, Kun; Zhang, Jue; Fang, Jing
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10
New Understanding on the Single-Trap Response under NBTI Stress and the Resulted Stochastic Degradation in Nanoscale MOSFETs 其他
2012-01-01
Ren, Pengpeng; Liu, Changze; Wang, Runsheng; Gong, Nanbo; Liu, Jinhua; Wu, Hanming; Huang, Ru
收藏  |  浏览/下载：1/0  |  提交时间：2015/11/13

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