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科研机构
北京大学 [24]
内容类型
期刊论文 [15]
其他 [9]
发表日期
2017 [3]
2016 [2]
2015 [2]
2014 [1]
2013 [4]
2011 [1]
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专题:北京大学
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Models for predicting TGO growth to rough interface in TBCs
期刊论文
SURFACE & COATINGS TECHNOLOGY, 2017
Shen, Q.
;
Yang, L.
;
Zhou, Y. C.
;
Wei, Y. G.
;
Wang, N. G.
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
Thermal barrier coatings
Interface roughness
Growth stress
Growth model
THERMAL BARRIER COATINGS
ISOTHERMAL OXIDATION BEHAVIOR
PULSED ELECTRON-BEAM
DAMAGE EVOLUTION
OXIDE THICKNESS
GAS-TURBINES
PREOXIDATION ATMOSPHERE
MECHANICAL-PROPERTIES
FAILURE MECHANISMS
LIFETIME BEHAVIOR
Tailoring the surface chemical bond states of the NbN films by doping Ag: Achieving hard hydrophobic surface
期刊论文
APPLIED SURFACE SCIENCE, 2017
Ren, Ping
;
Zhang, Kan
;
Du, Suxuan
;
Meng, Qingnan
;
He, Xin
;
Wang, Shuo
;
Wen, Mao
;
Zheng, Weitao
收藏
  |  
浏览/下载:118/0
  |  
提交时间:2017/12/03
Nb-Ag-N films
Surface chemical bond states
Ag2O
Hydrophobicity
Hardness
SUPERHYDROPHOBIC METALLIC SURFACES
THIN-FILMS
MAGNESIUM ALLOY
COATINGS
WATER
ROUGHNESS
CRN
CERAMICS
DYNAMICS
ENERGY
高超声速边界层感受性研究综述
期刊论文
实验流体力学, 2017
江贤洋
;
李存标
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2017/12/03
高超声速边界层
感受性
综述
理论研究
声波
粗糙元
壁面温度
hypersonic boundary layer
receptivity
review
theory research
acoustic
roughness
wall temperature
A Device-Level Characterization Approach to Quantify the Impacts of Different Random Variation Sources in FinFET Technology
期刊论文
IEEE ELECTRON DEVICE LETTERS, 2016
Jiang, Xiaobo
;
Guo, Shaofeng
;
Wang, Runsheng
;
Wang, Xingsheng
;
Cheng, Binjie
;
Asenov, Asen
;
Huang, Ru
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/04
FinFET
random variation
characterization
line-edge roughness (LER)
metal gate granularity (MGG)
LINE-EDGE ROUGHNESS
VARIABILITY
LWR
LER
Nanoscale Ge Fin Etching Using Inductively Coupled Plasma for Ge-based Multi-gate Devices
其他
2016-01-01
Bingxin Zhang
;
Xia An
;
Yuxuan Xia
;
Ming Li
;
Meng Lin
;
Peilin Hao
;
Xing Zhang
;
Ru Huang
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
roughness
etching
fabrication
uniformity
inductively
optimizing
layout
illustrated
scaling
removed
roughness
etching
fabrication
uniformity
inductively
optimizing
layout
illustrated
scaling
removed
Line-edge roughness induced single event transient variation in SOI FinFETs
期刊论文
半导体学报(英文版), 2015
Wu Weikang
;
An Xia
;
Jiang Xiaobo
;
Chen Yehua
;
Liu Jingjing
;
Zhang Xing
;
Huang Ru
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2017/12/03
heavy ion irradiation single event transient variation line-edge roughness SOI FinFET
heavy ion irradiation
single event transient
variation
line-edge roughness
SOI
FinFET
Focused-Ion-Beam Induced Rayleigh-Plateau Instability for Diversiform Suspended Nanostructure Fabrication
期刊论文
scientific reports, 2015
Li, Can
;
Zhao, Lurui
;
Mao, Yifei
;
Wu, Wengang
;
Xu, Jun
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2015/11/13
AU NANOWIRES
TECHNOLOGY
NANOMECHANICS
RESONATORS
ROUGHNESS
FILMS
Effect of surface mechanical attrition treatment on biodegradable Mg-1Ca alloy
期刊论文
materials science engineering c materials for biological applications, 2014
Li, N.
;
Li, Y. D.
;
Li, Y. X.
;
Wu, Y. H.
;
Zheng, Y. F.
;
Han, Y.
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2015/11/10
Biomedical Mg alloys
Mg-Ca
SMAT
Grain refinement
Corrosion resistance
AZ91D MAGNESIUM ALLOY
INDUCED GRAIN-REFINEMENT
CORROSION BEHAVIOR
PURE MAGNESIUM
CALCIUM ALLOY
BIO-CORROSION
MG ALLOY
BONE
LAYER
DEGRADATION
The effects of strain and surface roughness scattering on the quasi-ballistic characteristics of a Ge nanowire p-channel field-effect transistor
期刊论文
chinese physics b, 2013
Qin Jie-Yu
;
Du Gang
;
Liu Xiao-Yan
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2015/11/13
nanowire
strain
surface roughness scattering
quasi-ballistic
CARRIER TRANSPORT
QUANTUM DOTS
SILICON
DISTRIBUTIONS
DEPENDENCE
THICKNESS
GERMANIUM
MOBILITY
STRESS
MODEL
Back-Gate Bias Dependence of the Statistical Variability of FDSOI MOSFETs With Thin BOX
期刊论文
ieee电子器件汇刊, 2013
Yang, Yunxiang
;
Markov, Stanislav
;
Cheng, Binjie
;
Zain, Anis Suhaila Mohd
;
Liu, Xiaoyan
;
Asenov, Asen
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2015/11/13
Back-gate bias
line edge roughness (LER)
metal gate granularity (MGG)
random dopant fluctuation (RDF)
statistical variability (SV)
thin buried oxide (BOX)
INTRINSIC PARAMETER FLUCTUATIONS
SIMULATION
DECANANOMETER
IMPACT
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