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CORC

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车载无人机的多路影像采集与拼接 期刊论文
传感器与微系统, 2017
刘家利; 关桂霞; 赵海盟; 晏磊; 彭彬彬
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
Predictions of canonical wall-bounded turbulent flows via a modified k-omega equation 期刊论文
JOURNAL OF TURBULENCE, 2017
Chen, Xi; Hussain, Fazle; She, Zhen-Su
收藏  |  浏览/下载：7/0  |  提交时间：2017/12/03
Methane-oxygen detonation characteristics near their propagation limits in ducts 期刊论文
FUEL, 2016
Zhang, Bo; Shen, Xiaobo; Pang, Lei; Gao, Yuan
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
Off-Axis Imaging in Keel-Edge Pinhole Single Photon Emission Computed Tomography System Based on Monte Carlo Simulation 期刊论文
CHINESE PHYSICS LETTERS, 2016
Li, Su-Ying; Xie, Zhao-Heng; Huang, Zhi-Yu; Yang, Kun; Xu, Bai-Xuan; Ren, Qiu-Shi
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
Comprehensive Understanding of Hot Carrier Degradation in Multiple-fin SOI FinFETs 其他
2015-01-01
Jiang, Hai; Yin, Longxiang; Li, Yun; Xu, Nuo; Zhao, Kai; He, Yandong; Du, Gang; Liu, Xiaoyan; Zhang, Xing
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
Transport in a three-zone wetland: Flow velocity profile and environmental dispersion 期刊论文
communications in nonlinear science and numerical simulation, 2015
Wang, P.; Chen, G. Q.; Jiang, C. B.; Alsaedi, A.; Wu, Z.; Zeng, L.
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/10
Experimental study on the oxide trap coupling effect in metal oxide semiconductor field effect transistors with HfO2 gate dielectrics 期刊论文
应用物理学快报, 2014
Ren, Pengpeng; Wang, Runsheng; Jiang, Xiaobo; Qiu, Yingxin; Liu, Changze; Huang, Ru
收藏  |  浏览/下载：6/0  |  提交时间：2015/11/10
High temperature behavior of multi-region direct current current-voltage spectroscopy and relationship with shallow-trench-isolation-based high-voltage laterally diffused metal-oxide-semiconductor field-effect-transistors reliability 期刊论文
日本应用物理学杂志, 2014
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10
High temperature behavior of multi-region direct current current-voltage spectroscopy and relationship with shallow-trench-isolation-based high-voltage laterally diffused metal-oxide-semiconductor field-effect-transistors reliability 其他
2014-01-01
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
Understanding the Correlation of HCI and NBTI Degradation in pLDMOSFETs from MR-DCIV Technique 其他
2014-01-01
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏  |  浏览/下载：11/0  |  提交时间：2015/11/13

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