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Real-time and full-field deflection measurement of thin films electroplated on the single crystal silicon wafers 期刊论文
2010, 2010
Xide Li; Cheng Wei
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SEM in-situ investigation on failure of nanometallic film/substrate structures under three-point bending loading 期刊论文
2010, 2010
Wang, Xi-Shu; Yan, Cheng-Kun; Li, Ying; Xue, Yibin; Meng, Xiang-Kang; Wu, Bi-Sheng
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