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Effects of Shell Strain on Valence Band Structure and Transport Properties of Ge/Si1-xGex Core-Shell Nanowire 外文期刊
2010
作者:  Zhao, YN;  Xu, HH;  Du, G;  Liu, XY;  Fan, C
收藏  |  浏览/下载:11/0  |  提交时间:2010/11/26
Finite-element study of strain field in strained-Si MOSFET 外文期刊
2009
作者:  Liu, HH;  Xu, QX;  Duan, XF
收藏  |  浏览/下载:17/0  |  提交时间:2010/11/26
Study of strained-silicon channel metal-oxide-semiconductor field effect transistors by large angle convergent-beam electron diffraction 外文期刊
2008
作者:  Liu, HH;  Duan, XF;  Xu, QX;  Liu, BG
收藏  |  浏览/下载:13/0  |  提交时间:2010/11/26
Nanoscale strain analysis of strained-Si metal-oxide-semiconductor field effect transistors by large angle convergent-beam electron diffraction 外文期刊
2006
作者:  Liu, HH;  Duan, XF;  Qi, XY;  Xu, QX;  Li, HO
收藏  |  浏览/下载:15/0  |  提交时间:2010/11/26


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