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Low-frequency Testing of Through Silicon Vias for Defect Diagnosis in Three-dimensional Integration Circuit Stacking Technology 其他
2014-01-01
Xu, Yichao; Miao, Min; Fang, Runiu; Sun, Xin; Zhu, Yunhui; Sun, Minggang; Wang, Guanjiang; Jin, Yufeng
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03
Investigation of a TSV-RDL In-line Fault-Diagnosis System and Test Methodology for Wafer-level Commercial Production 其他
2014-01-01
Fang, Runiu; Miao, Min; Sun, Xin; Zhu, Yunhui; Wang, Guanjiang; Xu, Yichao; Sun, Minggang; Jin, Yufeng
收藏  |  浏览/下载:3/0  |  提交时间:2017/12/03
A novel acceleration switch with hat-like contact separated from proof mass 其他
2011-01-01
Zhang, Xiaoyang; Guo, Zhongyang; Lin, Longtao; Zhao, Qiancheng; Yan, Junjie; Yang, Zhenchuan; Yan, Guizhen
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/13
A Latching Acceleration Switch with Cylindrical Contacts Independent to the Proof-mass 其他
2009-01-01
Guo, Z. Y.; Yang, Z. C.; Lin, L. T.; Zhao, Q. C.; Ding, H. T.; Liu, X. S.; Chi, X. Z.; Cui, J.; Yan, G. Z.
收藏  |  浏览/下载:5/0  |  提交时间:2015/11/10


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