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Hole mobility in InSb-based devices: Dependence on surface orientation, body thickness, and strain 其他
2015-01-01
Chang, Pengying; Liu, Xiaoyan; Zeng, Lang; Du, Gang
收藏  |  浏览/下载:4/0  |  提交时间:2017/12/03
Defect Current and Defect Band Conduction of Ultrathin Oxides after Degradation and Breakdown 其他
2008-01-01
Xu, Mingzhen; Tan, Changhua
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/13
Model analysis and parameter extraction for MOS capacitor including quantum mechanical effects 其他
2006-01-01
Jiang, HY; Zhang, PW
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/16
XPS, AES and LEED studies of Cu deposited on Cr2O3(0001) surfaces 其他
1996-01-01
Guo, QL; Gui, LL; Moller, PJ; Binau, K
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/12


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