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An adaptive single event upset (SEU)-hardened flip-flop design 会议论文
2019 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2019, Xi'an, China, 2019-06-12
作者:  Zhang, Man;  Guo, Zhongjie;  Xu, WanCheng
收藏  |  浏览/下载：5/0  |  提交时间：2019/12/20
An Adaptive Single Event Upset (SFU)-Hardened Flip-Flop Design 会议论文
2019 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC), 2019-01-01
作者:  Zhang, Man;  Guo, ZhongJie;  Xu, WanCheng
收藏  |  浏览/下载：8/0  |  提交时间：2019/12/20
Novel Radiation Hardening Read/Write Circuits Using Feedback Connections for Spin-Orbit Torque Magnetic Random Access Memory 会议论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2019-05-01
作者:  Wang, Bi;  Wang, Zhaohao;  Wu, Bi;  Bai, Yumeng;  Cao, Kaihua
收藏  |  浏览/下载：18/0  |  提交时间：2019/12/30
A fault injection system for space imaging application 会议论文
Beijing, China, 2019-07-07
作者:  Wang, Jinqiao;  Duan, Yongqiang;  Ma, Tengfei
收藏  |  浏览/下载：0/0  |  提交时间：2020/03/04
Correlation between the Decoupling Capacitor Layouts and Single-Event-Upset Resistances of SRAM cells 会议论文
作者:  Zhentao Li;  Zheng ZS(郑中山);  Zhao K(赵凯);  Li B(李博);  Luo JJ(罗家俊)
收藏  |  浏览/下载：22/0  |  提交时间：2019/05/13
A Single Event Upset Tolerant Latch Design 会议论文
作者:  Haibin Wang;  Xixi Dai;  Yangsheng Wang;  Issam Nofal;  Li Cai
收藏  |  浏览/下载：35/0  |  提交时间：2019/05/13
The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose 会议论文
Geneva, SWITZERLAND, OCT 02-06, 2017
作者:  Zheng, Qiwen;  Cui, Jiangwei;  Lu, Wu;  Guo, Hongxia;  Liu, Jie
收藏  |  浏览/下载：38/0  |  提交时间：2018/10/08
Detection System of Single Event Upset Based onFPGA 会议论文
中国厦门, 2018
作者:  Bobo Feng;  Cuiping Shao;  Huiyun Li
收藏  |  浏览/下载：19/0  |  提交时间：2019/01/31
Design of A Compact and Reconfigurable Onboard Data Handling System 会议论文
Melbourne, AUSTRALIA, DEC 11-13, 2018
作者:  Zhou, Qing;  Zhao, Qingjie;  Zhou, Li;  An, Junshe;  Xue, Changbin
收藏  |  浏览/下载：56/0  |  提交时间：2019/06/26
SEE Characteristics of COTS Devices by 1064nm Pulsed Laser Backside Testing 会议论文
Waikoloa, HI, United states, July 16, 2018 - July 20, 2018
作者:  Ma, Yingqi;  Han, Jianwei;  Shangguan, Shipeng;  Chen, Rui;  Zhu, Xiang
收藏  |  浏览/下载：34/0  |  提交时间：2019/03/05

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