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浏览/检索结果: 共7条，第1-7条 帮助 限定条件 内容类型：会议论文     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Design of suppressing optical and recombination losses in ultrathin CuInGaSe2 solar cells by Voronoi nanocavity arrays 会议论文 作者:  Wang, Yi-Chung;  Chen, Chia-Wei;  Su, Teng-Yu;  Yang, Tzu-Yi;  Liu, Wen-Wu 收藏  |  浏览/下载：13/0  |  提交时间：2020/12/18 Alumina  Aluminum oxide  Copper alloys  Cost effectiveness  Efficiency  Electrodes  Entertainment industry  Film thickness  Finite difference time domain method  Gallium alloys  Indium alloys  Passivation  Semiconductor alloys  Thin films  Time domain analysisCIGS solar cells  Electrical performance  High-efficiency  Mass production  Passivation layer  Recombination loss  Structural modeling  Surface recombinations   Loss mechanisms and lifetimes of heavy ion beams in HIRFL-CSRe 会议论文 作者:  Xue, Y. L.;  Yamada, C;  Nakamura, N;  Azuma, T;  Wang, W. 收藏  |  浏览/下载：11/0  |  提交时间：2018/08/20 Loss mechanisms and lifetimes of heavy ion beams in HIRFL-CSRe 会议论文 作者:  Wang, W.;  Yamada, C;  Nakamura, N;  Xue, Y. L.;  Cai, X. 收藏  |  浏览/下载：8/0  |  提交时间：2018/08/20 Modification of defects induced by nuclear collisions in Fe and Ni in electronic stopping power regime 会议论文 作者:  Wang, ZG;  Dufour, C;  Jin, YF;  Hou, MD;  Jin, GM 收藏  |  浏览/下载：13/0  |  提交时间：2018/08/20 electronic energy loss  thermal spike  vacancy and interstitial  defect production and annealing  damage efficiency  recombination cross section   Modification of defects induced by nuclear collisions in Fe and Ni in electronic stopping power regime 会议论文 作者:  Wang, ZG;  Dufour, C;  Jin, YF;  Hou, MD;  Jin, GM 收藏  |  浏览/下载：17/0  |  提交时间：2018/08/20 electronic energy loss  thermal spike  vacancy and interstitial  defect production and annealing  damage efficiency  recombination cross section   Defect production and annealing induced by electronic energy loss in pure metal 会议论文 作者:  Wang, ZG;  Dufour, C;  Hou, MD;  Jin, GM;  Jin, YF 收藏  |  浏览/下载：13/0  |  提交时间：2018/08/20 electronic energy loss  thermal spike  vacancy and interstitial  stochastic thermal defect production and annealing  damage efficiency   Defect production and annealing induced by electronic energy loss in pure metal 会议论文 作者:  Wang, ZG;  Dufour, C;  Hou, MD;  Jin, GM;  Jin, YF 收藏  |  浏览/下载：12/0  |  提交时间：2018/08/20 electronic energy loss  thermal spike  vacancy and interstitial  stochastic thermal defect production and annealing  damage efficiency