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Study on Liquid-Solid Electromigration in Cu/Sn-9Zn/Cu Interconnect Using Synchrotron Radiation Real-Time in Situ Imaging Technology 会议论文
14th International Conference on Electronic Packaging Technology (ICEPT), Chinese Inst Elect, Dalian, PEOPLES R CHINA, 2013-08-11
作者:  Huang, Mingliang;  Zhang, Zhijie;  Zhao, Ning;  Feng, Xiaofei
收藏  |  浏览/下载:7/0  |  提交时间:2019/12/11
Effect of surface finish (OSP and ENEPIG) on failure mechanism induced by electromigration in Sn-3.0Ag-0.5Cu flip chip solder interconnect 会议论文
2011 International Symposium on Advanced Packaging Materials, APM 2011, Xiamen, 2011-10-25
作者:  Huang M.;  Chen L.;  Zhou S.;  Ye S.
收藏  |  浏览/下载:3/0  |  提交时间:2019/12/18
Effect of electromigration on intermetallic compound formation in Cu/Sn/Cu interconnect 会议论文
2009 International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2009, Beijing, 2009-08-10
作者:  Chen L.D.;  Huang M.
收藏  |  浏览/下载:1/0  |  提交时间:2019/12/24
Phase field simulation of solidification behavior and microstructure evolution of Sn-58Bi/Cu solder interconnect during reflow soldering proc (EI收录) 会议论文
Proceedings - 2013 14th International Conference on Electronic Packaging Technology, ICEPT 2013, Dalian, China, August 11, 2013 - August 14, 2013
作者:  Ma, Wen-Jing[1];  Ke, Chang-Bo[1];  Zhou, Min-Bo[1];  Zhang, Xin-Ping[1]
收藏  |  浏览/下载:0/0  |  提交时间:2019/04/15


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