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| Synthesis and Characterization of Three-dimensional Graphene Foams by Chemical Vapor Deposition 会议论文
2017 IMAPS NORDIC CONFERENCE ON MICROELECTRONICS PACKAGING (NORDPAC), 2017-01-01
作者: Zhang, Yong[1]; Samani, Majid Kabiri[2]; Liu, Johan[3]
  收藏 | 浏览/下载：2/0 | 提交时间：2019/04/24
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| Experimental investigation of the phase equilibria of Al-Zn-Ti system in Al-rich corner at 400 degrees C 会议论文
NEW MATERIALS, APPLICATIONS AND PROCESSES, PTS 1-3, 2011-12-23
作者: Luo, Qun[1]; Jin, Feng[2]; Li, Yang[3]; Li, Qian[4]; Zhang, Jie-Yu[5]
收藏 | 浏览/下载：3/0 | 提交时间：2019/04/30
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| Semiconductor overlayers for protecting silver nanoparticles of dye sensitized solar cells based on atomic layer deposition 会议论文
2011 Asia Communications and Photonics Conference and Exhibition, ACP 2011, 2011-11-13
作者: Sun, Xiaolan[1]; Liu, Xiaohong[2]; Li, Chao[3]; Xie, Libin[4]; Dong, Yanhua[5]
收藏 | 浏览/下载：3/0 | 提交时间：2019/04/30
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| Interfacial failure analysis of CdZnTe detectors by scanning acoustic microscopy and auger electron spectrum 会议论文
2005 Conference on High Density Microsystem Design and Packaging and Component Failure Analysis, HDP'05, 2005-06-27
作者: Qi, Zhang[1]; Wenbin, Sang[2]; Kaifeng, Qin[3]; Jiahua, Min[4]; Jianyong, Teng[5]
收藏 | 浏览/下载：3/0 | 提交时间：2019/05/10 |
| Interfacial failure analysis of CdZnTe detectors by scanning acoustic microscopy and Auger Electron Spectrum 会议论文
Proceedings of the Seventh IEEE CPMT Conference on High Density Microsystem Design, Packaging and Failure Analysis (HDP'05)
作者: Zhang Qi[1]; Sang Wenbin[2]; Qin Kaifeng[3]; Min Jiahua[4]; Teng Jianyong[5]
收藏 | 浏览/下载：4/0 | 提交时间：2019/05/10
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| Interfacial failure analysis of CdZnTe detectors by scanning acoustic microscopy and Auger Electron Spectrum 会议论文
Proceedings of the Seventh IEEE CPMT Conference on High Density Microsystem Design, Packaging and Failure Analysis (HDP'05), 2005-01-01
作者: Zhang Qi[1]; Sang Wenbin[2]; Qin Kaifeng[3]; Min Jiahua[4]; Teng Jianyong[5]
收藏 | 浏览/下载：4/0 | 提交时间：2019/05/10
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| Interfacial failure analysis of CdZnTe detectors by scanning acoustic microscopy and Auger Electron Spectrum 会议论文
Proceedings of the Seventh IEEE CPMT Conference on High Density Microsystem Design, Packaging and Failure Analysis (HDP'05)
作者: Zhang Qi[1]; Sang Wenbin[2]; Qin Kaifeng[3]; Min Jiahua[4]; Teng Jianyong[5]
收藏 | 浏览/下载：4/0 | 提交时间：2019/05/10
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| Interfacial failure analysis of CdZnTe detectors by scanning acoustic microscopy and Auger Electron Spectrum 会议论文
Proceedings of the Seventh IEEE CPMT Conference on High Density Microsystem Design, Packaging and Failure Analysis (HDP'05)
作者: Zhang Qi[1]; Sang Wenbin[2]; Qin Kaifeng[3]; Min Jiahua[4]; Teng Jianyong[5]
收藏 | 浏览/下载：2/0 | 提交时间：2019/05/10
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