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What Causes My Test Alarm? Automatic Cause Analysis for Test Alarms in System and Integration Testing 会议论文
2017 IEEE/ACM 39TH INTERNATIONAL CONFERENCE ON SOFTWARE ENGINEERING (ICSE), 2017-01-01
作者:  Jiang, He;  Li, Xiaochen;  Yang, Zijiang;  Xuan, Jifeng
收藏  |  浏览/下载:8/0  |  提交时间:2019/12/09
Design of a micro tensile testing structure to restrain non-axial alignment errors 会议论文
Proceedings of the International Conference on Integration and Commercialization of Micro and Nanosystems 2007, 2007-01-10
作者:  Zhang, D.;  Chu, J.;  Shen, H.
收藏  |  浏览/下载:3/0  |  提交时间:2019/12/27


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