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Method for measuring the concentration of trace gases by scar spectroscopy 专利
专利号: EP3356798A1, 申请日期: 2018-08-08, 公开日期: 2018-08-08
作者:  MAZZOTTI, DAVIDE;  CANCIO PASTOR, PABLO;  GALLI, IACOPO;  DE NATALE, PAOLO;  GIUSFREDI, GIOVANNI
收藏  |  浏览/下载:28/0  |  提交时间:2019/12/31
Method for selecting U-turn opening at signalized intersection that influences traffic flow, involves selecting best position of left-turn lane turning opening according to curve of left-turn lane capacity. 专利
申请日期: 2018-01-01, 公开日期: 2018-03-13
作者:  YAO R SUN L ZHANG W ZHENG L LONG M
收藏  |  浏览/下载:9/0  |  提交时间:2019/12/02
History earthquake wave image automatic tracking method, involves presenting earthquake wave curve to appear at inflection point of symmetry characteristic and earthquake wave line around medial axis to track earthquake wave line segment. 专利
申请日期: 2015-01-01, 公开日期: 2015-08-12
作者:  MENG T SUN Y WANG L
收藏  |  浏览/下载:3/0  |  提交时间:2019/12/09
Method for evaluating pore structure capability of micropore material, involves calculating pore structure parameter of sample by combining liquid imbibing gas freeing dynamic equations based on liquid imbibing gas freeing speed curve. 专利
申请日期: 2009-01-01, 公开日期: 2009-01-28
作者:  LIU S NIE L SU Y XU H XU S
收藏  |  浏览/下载:5/0  |  提交时间:2019/12/24
Method and structure for eliminating polarization instability in laterally-oxidized VCSELs 专利
专利号: US7160749, 申请日期: 2007-01-09, 公开日期: 2007-01-09
作者:  CHUA, CHRISTOPHER L.;  THORNTON, ROBERT L.;  TREAT, DAVID W.
收藏  |  浏览/下载:8/0  |  提交时间:2019/12/24
Apparatus and method for thermally tuning an optical amplifier 专利
专利号: AU2002346105A1, 申请日期: 2003-04-01, 公开日期: 2003-04-01
作者:  DEJNEKA, MATTHEW J.;  SAMSON, BRYCE N.
收藏  |  浏览/下载:11/0  |  提交时间:2019/12/30
Apparatus and method for thermally tuning an optical amplifier 专利
专利号: AU2002346105A1, 申请日期: 2003-04-01, 公开日期: 2003-04-01
作者:  DEJNEKA, MATTHEW J.;  SAMSON, BRYCE N.
收藏  |  浏览/下载:7/0  |  提交时间:2019/12/30
Detecting aging of optical components 专利
专利号: EP1167943A2, 申请日期: 2002-01-02, 公开日期: 2002-01-02
作者:  BROUTIN, SCOTT L.;  PLOURDE, JAMES KEVIN;  STAYT, JOHN WILLIAM, JR.
收藏  |  浏览/下载:9/0  |  提交时间:2019/12/31
Measuring equipment for optical characteristic of semiconductor laser 专利
专利号: JP1988028083A, 申请日期: 1988-02-05, 公开日期: 1988-02-05
作者:  KOBAYASHI ATSUYUKI;  ABE TOMOKO
收藏  |  浏览/下载:8/0  |  提交时间:2019/12/31


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