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The mechanism of Pd distribution in the process of FAB formation during Pd-coated Cu wire bonding 期刊论文
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2018, 卷号: 29, 期号: 16, 页码: 13774-13781
作者:  Du, YH;  Liu, ZQ;  Ji, HJ;  Li, MY;  Wen, M
收藏  |  浏览/下载:16/0  |  提交时间:2018/12/25
A superior interfacial reliability of Fe-Ni UBM during high temperature storage 期刊论文
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2017, 卷号: 28, 期号: 12, 页码: 8537-8545
Gao, Li-Yin; Li, Cai-Fu; Wan, Peng; Liu, Zhi-Quan
收藏  |  浏览/下载:23/0  |  提交时间:2017/08/17


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