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Scanning electron microscopy observation of in-device InAs/AlAs quantum dots by selective etching of capping layers 期刊论文
modern physics letters b, 2007, 卷号: 21, 期号: 14, 页码: 859-866
Sun, J; Zhou, DY; Li, RY; Zhao, C; Ye, XL; Xu, B; Chen, YH; Wang, ZG
收藏  |  浏览/下载:65/5  |  提交时间:2010/03/08
XPS depth profiling study of n/TCO interfaces for p-i-n amorphous silicon solar cells 期刊论文
applied surface science, 2006, 卷号: 253, 期号: 3, 页码: 1677-1682
Sheng SR (Sheng Shuran); Hao HY (Hao Huiying); Diao HW (Diao Hongwei); Zeng XB (Zeng Xiangbo); Xu Y (Xu Ying); Liao XB (Liao Xianbo); Monchesky TL (Monchesky Theodore L.)
收藏  |  浏览/下载:55/0  |  提交时间:2010/03/29
Microstructure of the silicon film prepared near the phase transition regime from amorphous to nanocrystalline 会议论文
symposium on quantum confined semiconductor nanostructures held at the 2002 mrs fall meeting, boston, ma, dec 02, 2001-dec 05, 2002
Zhang SB; Liao XB; Xu YY; Hu ZH; Zeng XB; Diao HW; Luo MC; Kong G
收藏  |  浏览/下载:18/0  |  提交时间:2010/10/29
Improvement of thin silicon on sapphire (SOS) film materials and device performances by solid phase epitaxy 期刊论文
materials science and engineering b-solid state materials for advanced technology, 2000, 卷号: 72, 期号: 2-3, 页码: 189-192
作者:  Yu F
收藏  |  浏览/下载:47/0  |  提交时间:2010/08/12
Improvement of thin silicon on sapphire (SOS) film materials and device performances by solid phase epitaxy 会议论文
international conference on advanced materials: sympopsium m - silicon-based materials and devices, beijing, peoples r china, jun 13-18, 1999
作者:  Yu F
收藏  |  浏览/下载:17/0  |  提交时间:2010/11/15


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